Refractive Index Compensation in Over-Determined Interferometric Systems
We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air representing a dominating source of uncertainty wh...
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MDPI AG
2012-10-01
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Series: | Sensors |
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Online Access: | http://www.mdpi.com/1424-8220/12/10/14084 |
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author | Zdeněk Buchta Jan Hrabina Martin Čížek Ondřej Číp Miroslava Holá Josef Lazar |
author_facet | Zdeněk Buchta Jan Hrabina Martin Čížek Ondřej Číp Miroslava Holá Josef Lazar |
author_sort | Zdeněk Buchta |
collection | DOAJ |
description | We present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air representing a dominating source of uncertainty when evaluated indirectly from the physical parameters of the atmosphere. Our proposal is based on the concept of an over-determined interferometric setup where a reference length is derived from a mechanical frame made from a material with a very low thermal coefficient. The technique allows one to track the variations of the refractive index of air on-line directly in the line of the measuring beam and to compensate for the fluctuations. The optical setup consists of three interferometers sharing the same beam path where two measure differentially the displacement while the third evaluates the changes in the measuring range, acting as a tracking refractometer. The principle is demonstrated in an experimental setup. |
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format | Article |
id | doaj.art-232add4aebb142ada258ab6927c2d2ad |
institution | Directory Open Access Journal |
issn | 1424-8220 |
language | English |
last_indexed | 2024-04-14T06:24:04Z |
publishDate | 2012-10-01 |
publisher | MDPI AG |
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series | Sensors |
spelling | doaj.art-232add4aebb142ada258ab6927c2d2ad2022-12-22T02:07:53ZengMDPI AGSensors1424-82202012-10-011210140841409410.3390/s121014084Refractive Index Compensation in Over-Determined Interferometric SystemsZdeněk BuchtaJan HrabinaMartin ČížekOndřej ČípMiroslava HoláJosef LazarWe present an interferometric technique based on a differential interferometry setup for measurement under atmospheric conditions. The key limiting factor in any interferometric dimensional measurement are fluctuations of the refractive index of air representing a dominating source of uncertainty when evaluated indirectly from the physical parameters of the atmosphere. Our proposal is based on the concept of an over-determined interferometric setup where a reference length is derived from a mechanical frame made from a material with a very low thermal coefficient. The technique allows one to track the variations of the refractive index of air on-line directly in the line of the measuring beam and to compensate for the fluctuations. The optical setup consists of three interferometers sharing the same beam path where two measure differentially the displacement while the third evaluates the changes in the measuring range, acting as a tracking refractometer. The principle is demonstrated in an experimental setup.http://www.mdpi.com/1424-8220/12/10/14084refractometrynanopositioninginterferometrynanometrology |
spellingShingle | Zdeněk Buchta Jan Hrabina Martin Čížek Ondřej Číp Miroslava Holá Josef Lazar Refractive Index Compensation in Over-Determined Interferometric Systems Sensors refractometry nanopositioning interferometry nanometrology |
title | Refractive Index Compensation in Over-Determined Interferometric Systems |
title_full | Refractive Index Compensation in Over-Determined Interferometric Systems |
title_fullStr | Refractive Index Compensation in Over-Determined Interferometric Systems |
title_full_unstemmed | Refractive Index Compensation in Over-Determined Interferometric Systems |
title_short | Refractive Index Compensation in Over-Determined Interferometric Systems |
title_sort | refractive index compensation in over determined interferometric systems |
topic | refractometry nanopositioning interferometry nanometrology |
url | http://www.mdpi.com/1424-8220/12/10/14084 |
work_keys_str_mv | AT zdenekbuchta refractiveindexcompensationinoverdeterminedinterferometricsystems AT janhrabina refractiveindexcompensationinoverdeterminedinterferometricsystems AT martincizek refractiveindexcompensationinoverdeterminedinterferometricsystems AT ondrejcip refractiveindexcompensationinoverdeterminedinterferometricsystems AT miroslavahola refractiveindexcompensationinoverdeterminedinterferometricsystems AT joseflazar refractiveindexcompensationinoverdeterminedinterferometricsystems |