A new low power high reliability flip-flop robust against process variations
Low scaling technology makes a significant reduction in dimension and supply voltage, and lead to new challenges about power consumption such as increasing nodes sensitivity over radiation-induced soft errors in VLSI circuits. In this area, different design methods have been proposed to low power fl...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Shahid Rajaee Teacher Training University
2016-07-01
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| Series: | Journal of Electrical and Computer Engineering Innovations |
| Subjects: | |
| Online Access: | https://jecei.sru.ac.ir/article_573_3c58cdbb99a01578f52a1a47dac87eba.pdf |