Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat

Candidate Genes and Quantitative Trait Loci for Grain Yield and Seed Size in Durum Wheat

Grain yield (YLD) is affected by thousand kernel weight (TKW) which reflects the combination of grain length (GL), grain width (GW) and grain area (AREA). Grain weight is also influenced by heading time (HT) and plant height (PH). To detect candidate genes and quantitative trait loci (QTL) of yield...

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Bibliographic Details
Main Authors: Giacomo Mangini, Antonio Blanco, Domenica Nigro, Massimo Antonio Signorile, Rosanna Simeone
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Plants
Subjects:
wheat
grain yield
grain size
candidate genes
QTL cluster
Online Access:https://www.mdpi.com/2223-7747/10/2/312

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