Spectrum Analysis Enabled Periodic Feature Reconstruction Based Automatic Defect Detection System for Electroluminescence Images of Photovoltaic Modules

Spectrum Analysis Enabled Periodic Feature Reconstruction Based Automatic Defect Detection System for Electroluminescence Images of Photovoltaic Modules

Electroluminescence (EL) imaging is a widely adopted method in quality assurance of the photovoltaic (PV) manufacturing industry. With the growing demand for high-quality PV products, automatic inspection methods based on machine vision have become an emerging area concern to replace manual inspecto...

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Bibliographic Details
Main Authors: Jiachuan Yu, Yuan Yang, Hui Zhang, Han Sun, Zhisheng Zhang, Zhijie Xia, Jianxiong Zhu, Min Dai, Haiying Wen
Format: Article
Language:English
Published: MDPI AG 2022-02-01
Series:Micromachines
Subjects:
defect detection
computer vision
spectrum analysis
photovoltaic module
electroluminescence image
Online Access:https://www.mdpi.com/2072-666X/13/2/332

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