Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized mol...
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| Format: | Article |
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MDPI AG
2017-04-01
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| Series: | Sensors |
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| Online Access: | http://www.mdpi.com/1424-8220/17/4/938 |
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| author | Lulu Zhou Mingjun Cai Ti Tong Hongda Wang |
| author_facet | Lulu Zhou Mingjun Cai Ti Tong Hongda Wang |
| author_sort | Lulu Zhou |
| collection | DOAJ |
| description | Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non-specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single-molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy. |
| first_indexed | 2024-04-11T21:43:34Z |
| format | Article |
| id | doaj.art-23b6cd90089d4cbf8d7e095c3b95816d |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-04-11T21:43:34Z |
| publishDate | 2017-04-01 |
| publisher | MDPI AG |
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| series | Sensors |
| spelling | doaj.art-23b6cd90089d4cbf8d7e095c3b95816d2022-12-22T04:01:28ZengMDPI AGSensors1424-82202017-04-0117493810.3390/s17040938s17040938Progress in the Correlative Atomic Force Microscopy and Optical MicroscopyLulu Zhou0Mingjun Cai1Ti Tong2Hongda Wang3State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, ChinaState Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, ChinaThe Second Hospital of Jilin University, Changchun 130041, ChinaState Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, ChinaAtomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution. However, AFM cannot provide the precise information of synchronized molecular groups and has many shortcomings in the aspects of determining the mechanism of the interactions and the elaborate structure due to the limitations of the technology, itself, such as non-specificity and low imaging speed. To overcome the technical limitations, it is necessary to combine AFM with other complementary techniques, such as fluorescence microscopy. The combination of several complementary techniques in one instrument has increasingly become a vital approach to investigate the details of the interactions among molecules and molecular dynamics. In this review, we reported the principles of AFM and optical microscopy, such as confocal microscopy and single-molecule localization microscopy, and focused on the development and use of correlative AFM and optical microscopy.http://www.mdpi.com/1424-8220/17/4/938atomic force microscopyconventional florescence microscopysuper-resolution fluorescence microscopycorrelation |
| spellingShingle | Lulu Zhou Mingjun Cai Ti Tong Hongda Wang Progress in the Correlative Atomic Force Microscopy and Optical Microscopy Sensors atomic force microscopy conventional florescence microscopy super-resolution fluorescence microscopy correlation |
| title | Progress in the Correlative Atomic Force Microscopy and Optical Microscopy |
| title_full | Progress in the Correlative Atomic Force Microscopy and Optical Microscopy |
| title_fullStr | Progress in the Correlative Atomic Force Microscopy and Optical Microscopy |
| title_full_unstemmed | Progress in the Correlative Atomic Force Microscopy and Optical Microscopy |
| title_short | Progress in the Correlative Atomic Force Microscopy and Optical Microscopy |
| title_sort | progress in the correlative atomic force microscopy and optical microscopy |
| topic | atomic force microscopy conventional florescence microscopy super-resolution fluorescence microscopy correlation |
| url | http://www.mdpi.com/1424-8220/17/4/938 |
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