Characteristic Test of Diode Based Multisim Software

In this study, a diode characteristic testing will be conducted, namely the characteristics of forward bias and reverse bias using Multisim software. Diode components are mostly applied to electronic circuits, so a simulation is needed to determine the performance of the diode before it is applied t...

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Main Authors: Muhammad Ruswandi Djalal, Rahmat Rahmat
Format: Article
Language:English
Published: Khairun University, Faculty of Engineering, Department of Electrical Engineering 2020-05-01
Series:Protek: Jurnal Ilmiah Teknik Elektro
Subjects:
Online Access:https://ejournal.unkhair.ac.id/index.php/protk/article/view/1213
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author Muhammad Ruswandi Djalal
Rahmat Rahmat
author_facet Muhammad Ruswandi Djalal
Rahmat Rahmat
author_sort Muhammad Ruswandi Djalal
collection DOAJ
description In this study, a diode characteristic testing will be conducted, namely the characteristics of forward bias and reverse bias using Multisim software. Diode components are mostly applied to electronic circuits, so a simulation is needed to determine the performance of the diode before it is applied to the circuit. The test to be carried out this time includes making a forward bias circuit and back bias on a diode, describing the characteristics of the diode, determining the diode's working point for a particular condition, and determining dc diode resistance in the forward bias and reverse bias. From the results of testing the forward bias characteristic, it can be seen that the silicon diode IN 4001 in forward bias increases the small current until the diode voltage (Vd) reaches its knee voltage (Vk) around 0.6 V - 0.7 V. After going through knee stress (Vk), then the increase in large currents. The workings of diodes like this can be said as diodes with deviant or biased currents. Whereas the reverse bias current is almost constant (almost close to zero) even though the voltage is increased continuously until it reaches a voltage of 50 V. How it works like this is called a diode with reverse current.
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spelling doaj.art-23c4c46e67074143beace0b75eb1c3722023-01-03T10:14:36ZengKhairun University, Faculty of Engineering, Department of Electrical EngineeringProtek: Jurnal Ilmiah Teknik Elektro2354-89242527-95722020-05-01711510.33387/protk.v7i1.12131128Characteristic Test of Diode Based Multisim SoftwareMuhammad Ruswandi Djalal0Rahmat RahmatPoliteknik Negeri Ujung PandangIn this study, a diode characteristic testing will be conducted, namely the characteristics of forward bias and reverse bias using Multisim software. Diode components are mostly applied to electronic circuits, so a simulation is needed to determine the performance of the diode before it is applied to the circuit. The test to be carried out this time includes making a forward bias circuit and back bias on a diode, describing the characteristics of the diode, determining the diode's working point for a particular condition, and determining dc diode resistance in the forward bias and reverse bias. From the results of testing the forward bias characteristic, it can be seen that the silicon diode IN 4001 in forward bias increases the small current until the diode voltage (Vd) reaches its knee voltage (Vk) around 0.6 V - 0.7 V. After going through knee stress (Vk), then the increase in large currents. The workings of diodes like this can be said as diodes with deviant or biased currents. Whereas the reverse bias current is almost constant (almost close to zero) even though the voltage is increased continuously until it reaches a voltage of 50 V. How it works like this is called a diode with reverse current.https://ejournal.unkhair.ac.id/index.php/protk/article/view/1213multisim, forward bias, reverse bias, diode, electronic
spellingShingle Muhammad Ruswandi Djalal
Rahmat Rahmat
Characteristic Test of Diode Based Multisim Software
Protek: Jurnal Ilmiah Teknik Elektro
multisim, forward bias, reverse bias, diode, electronic
title Characteristic Test of Diode Based Multisim Software
title_full Characteristic Test of Diode Based Multisim Software
title_fullStr Characteristic Test of Diode Based Multisim Software
title_full_unstemmed Characteristic Test of Diode Based Multisim Software
title_short Characteristic Test of Diode Based Multisim Software
title_sort characteristic test of diode based multisim software
topic multisim, forward bias, reverse bias, diode, electronic
url https://ejournal.unkhair.ac.id/index.php/protk/article/view/1213
work_keys_str_mv AT muhammadruswandidjalal characteristictestofdiodebasedmultisimsoftware
AT rahmatrahmat characteristictestofdiodebasedmultisimsoftware