Neg/pos-Normalized Accuracy Measures for Software Defect Prediction
In evaluating the performance of software defect prediction models, accuracy measures such as precision and recall are commonly used. However, most of these measures are affected by neg/pos ratio of the data set being predicted, where neg is the number of negative cases (defect-free modules) and pos...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9999179/ |