Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis
Abstract Sulphur hexafluoride (SF6) decomposed products analysis is highly critical in the early‐stage fault diagnosis of gas‐insulated switchgear (GIS). Spectrum technology outperforms traditional methods on non‐invasiveness, no sample preparation, and no consumption. Here, the authors present an i...
Main Authors: | , , , , , , |
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Format: | Article |
Language: | English |
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Wiley
2024-02-01
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Series: | High Voltage |
Online Access: | https://doi.org/10.1049/hve2.12355 |
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author | Jianxin Wang Weigen Chen Pinyi Wang Fu Wan Zhixian Zhang Shoufei Gao Yingying Wang |
author_facet | Jianxin Wang Weigen Chen Pinyi Wang Fu Wan Zhixian Zhang Shoufei Gao Yingying Wang |
author_sort | Jianxin Wang |
collection | DOAJ |
description | Abstract Sulphur hexafluoride (SF6) decomposed products analysis is highly critical in the early‐stage fault diagnosis of gas‐insulated switchgear (GIS). Spectrum technology outperforms traditional methods on non‐invasiveness, no sample preparation, and no consumption. Here, the authors present an improved fibre‐enhanced Raman spectroscopy (FERS) as a comprehensive analytical tool to detect a suite of SF6 decomposed products (SO2F2, SOF2, SO2, H2S, CF4, OCS, CO2, and CO). The FERS approach is combined with two iris diaphragms for spatial filtering and a rear‐end reflector for additional Raman signal enhancement. Limits of detection down to 1 × 10−6–8 × 10−6 are achieved for different SF6 decompositions, and quantification of an undefined multigas, sampled from an 800 kV GIS in service, is realised utilising SF6 as the internal standard gas and with a maximum error of 5.5 %. The GIS is diagnosed according to the results and confirmed by an on‐site check. The authors foresee that this technique will provide a route for trace gas analysis in the power industry. |
first_indexed | 2024-03-07T21:20:40Z |
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id | doaj.art-2446766cd42841a2a8864544bb52aaaa |
institution | Directory Open Access Journal |
issn | 2397-7264 |
language | English |
last_indexed | 2024-03-07T21:20:40Z |
publishDate | 2024-02-01 |
publisher | Wiley |
record_format | Article |
series | High Voltage |
spelling | doaj.art-2446766cd42841a2a8864544bb52aaaa2024-02-27T13:33:16ZengWileyHigh Voltage2397-72642024-02-019120621610.1049/hve2.12355Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosisJianxin Wang0Weigen Chen1Pinyi Wang2Fu Wan3Zhixian Zhang4Shoufei Gao5Yingying Wang6School of Electrical Engineering Chongqing University Chongqing ChinaSchool of Electrical Engineering Chongqing University Chongqing ChinaSchool of Electrical Engineering Chongqing University Chongqing ChinaSchool of Electrical Engineering Chongqing University Chongqing ChinaSchool of Electrical Engineering Chongqing University Chongqing ChinaInstitute of Photonics Technology Jinan University Guangzhou ChinaInstitute of Photonics Technology Jinan University Guangzhou ChinaAbstract Sulphur hexafluoride (SF6) decomposed products analysis is highly critical in the early‐stage fault diagnosis of gas‐insulated switchgear (GIS). Spectrum technology outperforms traditional methods on non‐invasiveness, no sample preparation, and no consumption. Here, the authors present an improved fibre‐enhanced Raman spectroscopy (FERS) as a comprehensive analytical tool to detect a suite of SF6 decomposed products (SO2F2, SOF2, SO2, H2S, CF4, OCS, CO2, and CO). The FERS approach is combined with two iris diaphragms for spatial filtering and a rear‐end reflector for additional Raman signal enhancement. Limits of detection down to 1 × 10−6–8 × 10−6 are achieved for different SF6 decompositions, and quantification of an undefined multigas, sampled from an 800 kV GIS in service, is realised utilising SF6 as the internal standard gas and with a maximum error of 5.5 %. The GIS is diagnosed according to the results and confirmed by an on‐site check. The authors foresee that this technique will provide a route for trace gas analysis in the power industry.https://doi.org/10.1049/hve2.12355 |
spellingShingle | Jianxin Wang Weigen Chen Pinyi Wang Fu Wan Zhixian Zhang Shoufei Gao Yingying Wang Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis High Voltage |
title | Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis |
title_full | Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis |
title_fullStr | Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis |
title_full_unstemmed | Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis |
title_short | Analysis of SF6 decomposed products by fibre‐enhanced Raman spectroscopy for gas‐insulated switchgear diagnosis |
title_sort | analysis of sf6 decomposed products by fibre enhanced raman spectroscopy for gas insulated switchgear diagnosis |
url | https://doi.org/10.1049/hve2.12355 |
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