Optical properties of Ternary Se80-xTe20Gex Thin Films
The present paper deals with prepared of ternary Se80-xTe20Gex system alloys and thin films. The XRD analysis improved that the amorphous structure of alloys and thin films for ternary Se80-xTe20Gex (at x=10and 20at.%Ge) which prepared by thermal evaporation techniques with thickness 250 nm. The op...
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Format: | Article |
Language: | English |
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University of Baghdad
2010-12-01
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Series: | Iraqi Journal of Physics |
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Online Access: | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/832 |
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author | Issam M. Ibrahim |
author_facet | Issam M. Ibrahim |
author_sort | Issam M. Ibrahim |
collection | DOAJ |
description |
The present paper deals with prepared of ternary Se80-xTe20Gex system alloys and thin films. The XRD analysis improved that the amorphous structure of alloys and thin films for ternary Se80-xTe20Gex (at x=10and 20at.%Ge) which prepared by thermal evaporation techniques with thickness 250 nm. The optical energy gap measurements show that the optical energy gap decreases with increasing of (Ge) content from (1.7 to 1.47 eV)
It is found that the optical constants, such as refractive
index ,extinction coefficient, real and imaginary dielectric
constant are non systematic with increasing of Ge contents
and annealing temperatures
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first_indexed | 2024-04-10T00:40:21Z |
format | Article |
id | doaj.art-2510b6aa2c7b48789f87605ee805555d |
institution | Directory Open Access Journal |
issn | 2070-4003 2664-5548 |
language | English |
last_indexed | 2024-04-10T00:40:21Z |
publishDate | 2010-12-01 |
publisher | University of Baghdad |
record_format | Article |
series | Iraqi Journal of Physics |
spelling | doaj.art-2510b6aa2c7b48789f87605ee805555d2023-03-14T05:48:01ZengUniversity of BaghdadIraqi Journal of Physics2070-40032664-55482010-12-01813Optical properties of Ternary Se80-xTe20Gex Thin FilmsIssam M. Ibrahim0Department of physics, College of Science, University of Baghdad The present paper deals with prepared of ternary Se80-xTe20Gex system alloys and thin films. The XRD analysis improved that the amorphous structure of alloys and thin films for ternary Se80-xTe20Gex (at x=10and 20at.%Ge) which prepared by thermal evaporation techniques with thickness 250 nm. The optical energy gap measurements show that the optical energy gap decreases with increasing of (Ge) content from (1.7 to 1.47 eV) It is found that the optical constants, such as refractive index ,extinction coefficient, real and imaginary dielectric constant are non systematic with increasing of Ge contents and annealing temperatures https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/832Se 80-xTe20Gex Thin Films Optical properties |
spellingShingle | Issam M. Ibrahim Optical properties of Ternary Se80-xTe20Gex Thin Films Iraqi Journal of Physics Se 80-xTe20Gex Thin Films Optical properties |
title | Optical properties of Ternary Se80-xTe20Gex Thin Films |
title_full | Optical properties of Ternary Se80-xTe20Gex Thin Films |
title_fullStr | Optical properties of Ternary Se80-xTe20Gex Thin Films |
title_full_unstemmed | Optical properties of Ternary Se80-xTe20Gex Thin Films |
title_short | Optical properties of Ternary Se80-xTe20Gex Thin Films |
title_sort | optical properties of ternary se80 xte20gex thin films |
topic | Se 80-xTe20Gex Thin Films Optical properties |
url | https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/832 |
work_keys_str_mv | AT issammibrahim opticalpropertiesofternaryse80xte20gexthinfilms |