| Summary: | During the measurement of s-parameters, using the de-embedding method to remove the influence of fixture is important. The proposed method decomposes the s-parameter of fixture by time domains. Then the ABCD matric is used to remove the decomposed fixture and get the s-parameter of device under test. By designing printed circuit board to do some experiments, and compare the proposed method with the other two traditional methods, AFR and Delta L. The results prove that this method is valid and accurate under high-frequency signal. Due to the facture that the algorithm decomposes first and then de-embeds, it can be applied to the situation that the left and right fixture are different.
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