Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights

Doping semiconductor oxides with trace amounts of non-native elements can improve their properties such as bandgap and conductivity. The lack of local techniques makes the precise characterization of these materials difficult. Among the few techniques capable of providing local characterization, tho...

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Main Authors: Anastasia Burimova, Artur Wilson Carbonari, Nicole Pereira de Lima, Arnaldo Alves Miranda Filho, Alexandre Pinho dos Santos Souza, Tatiane da Silva Nascimento Sales, Wanderson Lobato Ferreira, Luciano Fabricio Dias Pereira, Bruno Santos Correa, Rajendra Narain Saxena
Format: Article
Language:English
Published: MDPI AG 2022-08-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/12/9/1204
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author Anastasia Burimova
Artur Wilson Carbonari
Nicole Pereira de Lima
Arnaldo Alves Miranda Filho
Alexandre Pinho dos Santos Souza
Tatiane da Silva Nascimento Sales
Wanderson Lobato Ferreira
Luciano Fabricio Dias Pereira
Bruno Santos Correa
Rajendra Narain Saxena
author_facet Anastasia Burimova
Artur Wilson Carbonari
Nicole Pereira de Lima
Arnaldo Alves Miranda Filho
Alexandre Pinho dos Santos Souza
Tatiane da Silva Nascimento Sales
Wanderson Lobato Ferreira
Luciano Fabricio Dias Pereira
Bruno Santos Correa
Rajendra Narain Saxena
author_sort Anastasia Burimova
collection DOAJ
description Doping semiconductor oxides with trace amounts of non-native elements can improve their properties such as bandgap and conductivity. The lack of local techniques makes the precise characterization of these materials difficult. Among the few techniques capable of providing local characterization, those based on hyperfine interactions at probe nuclei have the advantage of being well established, probing the material homogeneously and completely, thus investigating different regions of material. Some of these techniques are also quite sensitive even at extremely low dopant concentrations. The perturbed angular correlation technique, combined with first-principles calculations, has recently been shown to be a powerful method for characterizing doped semiconductor oxides. In this paper, we present a brief review of the unique information extracted from the semiconductor investigation with such a complex approach, including semiconductor oxides doped with cadmium and other elements. A strong relationship between the local environment, including electronic structure, and the nature of the dopant and the native element of the doped oxides is also shown.
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spelling doaj.art-25398e1d898a40f0bda5229a80603c1c2023-11-23T15:43:06ZengMDPI AGCrystals2073-43522022-08-01129120410.3390/cryst12091204Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical InsightsAnastasia Burimova0Artur Wilson Carbonari1Nicole Pereira de Lima2Arnaldo Alves Miranda Filho3Alexandre Pinho dos Santos Souza4Tatiane da Silva Nascimento Sales5Wanderson Lobato Ferreira6Luciano Fabricio Dias Pereira7Bruno Santos Correa8Rajendra Narain Saxena9Instituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilInstituto de Pesquisas Energéticas e Nucleares IPEN-CNEN/SP, São Paulo 05508-000, BrazilDoping semiconductor oxides with trace amounts of non-native elements can improve their properties such as bandgap and conductivity. The lack of local techniques makes the precise characterization of these materials difficult. Among the few techniques capable of providing local characterization, those based on hyperfine interactions at probe nuclei have the advantage of being well established, probing the material homogeneously and completely, thus investigating different regions of material. Some of these techniques are also quite sensitive even at extremely low dopant concentrations. The perturbed angular correlation technique, combined with first-principles calculations, has recently been shown to be a powerful method for characterizing doped semiconductor oxides. In this paper, we present a brief review of the unique information extracted from the semiconductor investigation with such a complex approach, including semiconductor oxides doped with cadmium and other elements. A strong relationship between the local environment, including electronic structure, and the nature of the dopant and the native element of the doped oxides is also shown.https://www.mdpi.com/2073-4352/12/9/1204dopingsemiconductor oxideshyperfine interactionsperturbed angular correlations
spellingShingle Anastasia Burimova
Artur Wilson Carbonari
Nicole Pereira de Lima
Arnaldo Alves Miranda Filho
Alexandre Pinho dos Santos Souza
Tatiane da Silva Nascimento Sales
Wanderson Lobato Ferreira
Luciano Fabricio Dias Pereira
Bruno Santos Correa
Rajendra Narain Saxena
Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
Crystals
doping
semiconductor oxides
hyperfine interactions
perturbed angular correlations
title Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
title_full Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
title_fullStr Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
title_full_unstemmed Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
title_short Local Crystalline Structure of Doped Semiconductor Oxides Characterized by Perturbed Angular Correlations: Experimental and Theoretical Insights
title_sort local crystalline structure of doped semiconductor oxides characterized by perturbed angular correlations experimental and theoretical insights
topic doping
semiconductor oxides
hyperfine interactions
perturbed angular correlations
url https://www.mdpi.com/2073-4352/12/9/1204
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