Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films
Perovskite solar cells represent the most attractive emerging photovoltaic technology, but their practical implementation is limited by solar cell devices’ low levels of operational stability. The electric field represents one of the key stress factors leading to the fast degradation of perovskite s...
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MDPI AG
2023-06-01
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| Online Access: | https://www.mdpi.com/1996-1944/16/12/4277 |
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| author | Nikita A. Emelianov Victoria V. Ozerova Yuri S. Fedotov Mikhail V. Zhidkov Rasim R. Saifutyarov Maria S. Malozovskaya Mikhail S. Leshchev Eugeniy V. Golosov Lyubov A. Frolova Pavel A. Troshin |
| author_facet | Nikita A. Emelianov Victoria V. Ozerova Yuri S. Fedotov Mikhail V. Zhidkov Rasim R. Saifutyarov Maria S. Malozovskaya Mikhail S. Leshchev Eugeniy V. Golosov Lyubov A. Frolova Pavel A. Troshin |
| author_sort | Nikita A. Emelianov |
| collection | DOAJ |
| description | Perovskite solar cells represent the most attractive emerging photovoltaic technology, but their practical implementation is limited by solar cell devices’ low levels of operational stability. The electric field represents one of the key stress factors leading to the fast degradation of perovskite solar cells. To mitigate this issue, one must gain a deep mechanistic understanding of the perovskite aging pathways associated with the action of the electric field. Since degradation processes are spatially heterogeneous, the behaviors of perovskite films under an applied electric field should be visualized with nanoscale resolution. Herein, we report a direct nanoscale visualization of methylammonium (MA<sup>+</sup>) cation dynamics in methylammonium lead iodide (MAPbI<sub>3</sub>) films during field-induced degradation, using infrared scattering-type scanning near-field microscopy (IR s-SNOM). The obtained data reveal that the major aging pathways are related to the anodic oxidation of I<sup>−</sup> and the cathodic reduction of MA<sup>+</sup>, which finally result in the depletion of organic species in the channel of the device and the formation of Pb. This conclusion was supported by a set of complementary techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS), photoluminescence (PL) microscopy, scanning electron microscopy (SEM) and energy-dispersive X-ray (EDX) microanalysis. The obtained results demonstrate that IR s-SNOM represents a powerful technique for studying the spatially resolved field-induced degradation dynamics of hybrid perovskite absorbers and the identification of more promising materials resistant to the electric field. |
| first_indexed | 2024-03-11T02:12:09Z |
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| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-11T02:12:09Z |
| publishDate | 2023-06-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Materials |
| spelling | doaj.art-2575218fb55e4d538d7abe6dd7965cda2023-11-18T11:24:00ZengMDPI AGMaterials1996-19442023-06-011612427710.3390/ma16124277Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin FilmsNikita A. Emelianov0Victoria V. Ozerova1Yuri S. Fedotov2Mikhail V. Zhidkov3Rasim R. Saifutyarov4Maria S. Malozovskaya5Mikhail S. Leshchev6Eugeniy V. Golosov7Lyubov A. Frolova8Pavel A. Troshin9Federal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaInstitute of Solid State Physics, Russian Academy of Sciences, Academician Osipyan Str. 2, Chernogolovka 142432, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaNational Research Centre “Kurchatov Institute”, Moscow 123182, RussiaNational Research Centre “Kurchatov Institute”, Moscow 123182, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaFederal Research Center of Problems of Chemical Physics and Medicinal Chemistry, Russian Academy of Sciences, Academician Semenov Ave. 1, Chernogolovka 142432, RussiaPerovskite solar cells represent the most attractive emerging photovoltaic technology, but their practical implementation is limited by solar cell devices’ low levels of operational stability. The electric field represents one of the key stress factors leading to the fast degradation of perovskite solar cells. To mitigate this issue, one must gain a deep mechanistic understanding of the perovskite aging pathways associated with the action of the electric field. Since degradation processes are spatially heterogeneous, the behaviors of perovskite films under an applied electric field should be visualized with nanoscale resolution. Herein, we report a direct nanoscale visualization of methylammonium (MA<sup>+</sup>) cation dynamics in methylammonium lead iodide (MAPbI<sub>3</sub>) films during field-induced degradation, using infrared scattering-type scanning near-field microscopy (IR s-SNOM). The obtained data reveal that the major aging pathways are related to the anodic oxidation of I<sup>−</sup> and the cathodic reduction of MA<sup>+</sup>, which finally result in the depletion of organic species in the channel of the device and the formation of Pb. This conclusion was supported by a set of complementary techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS), photoluminescence (PL) microscopy, scanning electron microscopy (SEM) and energy-dispersive X-ray (EDX) microanalysis. The obtained results demonstrate that IR s-SNOM represents a powerful technique for studying the spatially resolved field-induced degradation dynamics of hybrid perovskite absorbers and the identification of more promising materials resistant to the electric field.https://www.mdpi.com/1996-1944/16/12/4277methylammonium lead iodide (MAPbI<sub>3</sub>)field-induced degradationinfrared scattering-type scanning near-field microscopy (IR s-SNOM)photoluminescence (PL) microscopyconfocal microscopyscanning electron microscopy (SEM) |
| spellingShingle | Nikita A. Emelianov Victoria V. Ozerova Yuri S. Fedotov Mikhail V. Zhidkov Rasim R. Saifutyarov Maria S. Malozovskaya Mikhail S. Leshchev Eugeniy V. Golosov Lyubov A. Frolova Pavel A. Troshin Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films Materials methylammonium lead iodide (MAPbI<sub>3</sub>) field-induced degradation infrared scattering-type scanning near-field microscopy (IR s-SNOM) photoluminescence (PL) microscopy confocal microscopy scanning electron microscopy (SEM) |
| title | Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films |
| title_full | Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films |
| title_fullStr | Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films |
| title_full_unstemmed | Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films |
| title_short | Direct Nanoscale Visualization of the Electric-Field-Induced Aging Dynamics of MAPbI<sub>3</sub> Thin Films |
| title_sort | direct nanoscale visualization of the electric field induced aging dynamics of mapbi sub 3 sub thin films |
| topic | methylammonium lead iodide (MAPbI<sub>3</sub>) field-induced degradation infrared scattering-type scanning near-field microscopy (IR s-SNOM) photoluminescence (PL) microscopy confocal microscopy scanning electron microscopy (SEM) |
| url | https://www.mdpi.com/1996-1944/16/12/4277 |
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