Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles

Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles

The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this p...

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Bibliographic Details
Main Authors: Nicolas Feltin, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, Sébastien Artous, François Saint-Antonin, Christoph Salzmann, Jérôme Deumer, Christian Gollwitzer, Richard Koops, Noham Sebaïhi, Richard Fontanges, Matthias Neuwirth, Detlef Bergmann, Dorothee Hüser, Tobias Klein, Vasile-Dan Hodoroaba
Format: Article
Language:English
Published: MDPI AG 2023-03-01
Series:Nanomaterials
Subjects:
certified reference nanomaterials
traceable nanoparticle size measurements
hybrid metrology
scanning probe microscopy
small-angle X-ray scattering
electron microscopy
Online Access:https://www.mdpi.com/2079-4991/13/6/993

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