Reduced defect density in crystalline halide perovskite films via methylamine treatment for the application in photodetectors

Considerable efforts have been devoted to optimizing and controlling the morphology and electronic properties of lead halide perovskites. The defect density of a perovskite layer strongly depends on the processing conditions. Consequently, the fabrication process of high-quality films is often compl...

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Bibliographic Details
Main Authors: Emilia R. Schütz, Azhar Fakharuddin, Yenal Yalcinkaya, Efrain Ochoa-Martinez, Shanti Bijani, Abd. Rashid bin Mohd Yusoff, Maria Vasilopoulou, Tobias Seewald, Ullrich Steiner, Stefan A. L. Weber, Lukas Schmidt-Mende
Format: Article
Language:English
Published: AIP Publishing LLC 2022-08-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0093333
Description
Summary:Considerable efforts have been devoted to optimizing and controlling the morphology and electronic properties of lead halide perovskites. The defect density of a perovskite layer strongly depends on the processing conditions. Consequently, the fabrication process of high-quality films is often complex, and reproducibility is a challenge. In this work, we present a methylamine gas-based method to recrystallize perovskite layers of any given quality in a controlled way, leading to millimeter-sized domains. Crystallinity significantly increases upon methylamine treatment, and crystal growth follows a preferred orientation. Photoluminescence- and space-charge limited current measurements show that the trap density halves after recrystallization. Conductive atomic force microscopy measurements show a higher surface conductivity and an improved spatial homogeneity after methylamine treatment. When applied in photodetectors, the improved film quality of the recrystallized films leads to increased detectivities of ≈4 × 1011 Jones compared to 3 × 109 Jones of a reference device. The response time falls from 0.1 to 10−5 s upon methylamine treatment. Our work, thus, presents a promising route to fabricating reproducible, high-quality perovskite films through well-controllable recrystallization.
ISSN:2166-532X