Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test
This study presents the results of severe accelerated tests carried out on four encapsulated amorphous silicon (a-Si) mini-modules. All the a-Si mini-modules were exposed to a 85 °C and 85% relative humidity damp heat (DH) prolonged treatment for 5000 h representing five times the duration specified...
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| Format: | Article |
| Language: | English |
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EDP Sciences
2023-01-01
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| Series: | EPJ Photovoltaics |
| Subjects: | |
| Online Access: | https://www.epj-pv.org/articles/epjpv/full_html/2023/01/pv230007/pv230007.html |
| _version_ | 1797737135776727040 |
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| author | Vincent Julia Posa Venkata Ramana Khouzam Ali Logerais Pierre-Olivier El Yaakoubi Mustapha Labouret Anne |
| author_facet | Vincent Julia Posa Venkata Ramana Khouzam Ali Logerais Pierre-Olivier El Yaakoubi Mustapha Labouret Anne |
| author_sort | Vincent Julia |
| collection | DOAJ |
| description | This study presents the results of severe accelerated tests carried out on four encapsulated amorphous silicon (a-Si) mini-modules. All the a-Si mini-modules were exposed to a 85 °C and 85% relative humidity damp heat (DH) prolonged treatment for 5000 h representing five times the duration specified by the IEC 61215 standard for qualification tests. For two of the four mini-modules, the DH test was preceded by a severe UV preconditioning, by applying 30 times the dose of 15 kWh/m2 at a temperature of 50 °C as prescribed by the IEC 61215 standard, in order to enhance the degradation during the following DH test and to reduce the overall testing time. I–V curves were plotted with a time step of 100 h under standard test conditions (STC) using a class A solar simulator and a source meter in order to monitor the degradation throughout both the tests. A visual inspection with photographic capturing was also performed at each stage to detect the apparent defects. Corrosion observed after 2000 h owing to the ingress of humidity is explained here by two possible infiltration paths in the layers of the mini-modules. Delamination occurred after 5000 h for the PV mini-modules which underwent the extended DH test. After 5000 h of damp heat testing, the degradation of the maximal power (Pmax) was found to be slightly accelerated for the a-Si mini-modules that were previously exposed to a severe UV preconditioning, with a value reaching 80% of its initial value, whereas, for the others only subjected to the prolonged DH test, the maximal power remained above 80% of its initial value. In all cases, the mini-modules seemed highly reliable with no failure after 5000 h of accelerated testing, and, based on an equivalent time of 20 years for 1000 h of accelerated test, they would exhibit a limited degradation rate of 0.2%/year in outdoor field conditions. |
| first_indexed | 2024-03-12T13:24:01Z |
| format | Article |
| id | doaj.art-26af87cfeed04662ae08f1affd23eb06 |
| institution | Directory Open Access Journal |
| issn | 2105-0716 |
| language | English |
| last_indexed | 2024-03-12T13:24:01Z |
| publishDate | 2023-01-01 |
| publisher | EDP Sciences |
| record_format | Article |
| series | EPJ Photovoltaics |
| spelling | doaj.art-26af87cfeed04662ae08f1affd23eb062023-08-25T09:32:47ZengEDP SciencesEPJ Photovoltaics2105-07162023-01-01142510.1051/epjpv/2023014pv230007Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH testVincent Julia0Posa Venkata Ramana1Khouzam Ali2Logerais Pierre-Olivier3El Yaakoubi Mustapha4Labouret Anne5Univ Paris-Est Créteil, CERTES, IUT de Sénart-Fontainebleau, 36 rue Georges CharpakUniv Paris-Est Créteil, CERTES, IUT de Sénart-Fontainebleau, 36 rue Georges CharpakUniv Paris-Est Créteil, CERTES, IUT de Sénart-Fontainebleau, 36 rue Georges CharpakUniv Paris-Est Créteil, CERTES, IUT de Sénart-Fontainebleau, 36 rue Georges CharpakSLITE-Source, 3 rue Léon BlumSOLEMS, 3 rue Léon BlumThis study presents the results of severe accelerated tests carried out on four encapsulated amorphous silicon (a-Si) mini-modules. All the a-Si mini-modules were exposed to a 85 °C and 85% relative humidity damp heat (DH) prolonged treatment for 5000 h representing five times the duration specified by the IEC 61215 standard for qualification tests. For two of the four mini-modules, the DH test was preceded by a severe UV preconditioning, by applying 30 times the dose of 15 kWh/m2 at a temperature of 50 °C as prescribed by the IEC 61215 standard, in order to enhance the degradation during the following DH test and to reduce the overall testing time. I–V curves were plotted with a time step of 100 h under standard test conditions (STC) using a class A solar simulator and a source meter in order to monitor the degradation throughout both the tests. A visual inspection with photographic capturing was also performed at each stage to detect the apparent defects. Corrosion observed after 2000 h owing to the ingress of humidity is explained here by two possible infiltration paths in the layers of the mini-modules. Delamination occurred after 5000 h for the PV mini-modules which underwent the extended DH test. After 5000 h of damp heat testing, the degradation of the maximal power (Pmax) was found to be slightly accelerated for the a-Si mini-modules that were previously exposed to a severe UV preconditioning, with a value reaching 80% of its initial value, whereas, for the others only subjected to the prolonged DH test, the maximal power remained above 80% of its initial value. In all cases, the mini-modules seemed highly reliable with no failure after 5000 h of accelerated testing, and, based on an equivalent time of 20 years for 1000 h of accelerated test, they would exhibit a limited degradation rate of 0.2%/year in outdoor field conditions.https://www.epj-pv.org/articles/epjpv/full_html/2023/01/pv230007/pv230007.htmlphotovoltaicamorphous siliconmini-modulesaccelerated testcorrosion |
| spellingShingle | Vincent Julia Posa Venkata Ramana Khouzam Ali Logerais Pierre-Olivier El Yaakoubi Mustapha Labouret Anne Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test EPJ Photovoltaics photovoltaic amorphous silicon mini-modules accelerated test corrosion |
| title | Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test |
| title_full | Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test |
| title_fullStr | Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test |
| title_full_unstemmed | Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test |
| title_short | Analysis of the degradation of amorphous silicon mini-modules under a severe sequential UV/DH test |
| title_sort | analysis of the degradation of amorphous silicon mini modules under a severe sequential uv dh test |
| topic | photovoltaic amorphous silicon mini-modules accelerated test corrosion |
| url | https://www.epj-pv.org/articles/epjpv/full_html/2023/01/pv230007/pv230007.html |
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