Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy
Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects betwee...
| Main Authors: | , , , , |
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| Formato: | Artigo |
| Idioma: | English |
| Publicado em: |
Beilstein-Institut
2019-05-01
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| Colecção: | Beilstein Journal of Nanotechnology |
| Assuntos: | |
| Acesso em linha: | https://doi.org/10.3762/bjnano.10.106 |
| _version_ | 1830490024223703040 |
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| author | Alexander Krivcov Jasmin Ehrler Marc Fuhrmann Tanja Junkers Hildegard Möbius |
| author_facet | Alexander Krivcov Jasmin Ehrler Marc Fuhrmann Tanja Junkers Hildegard Möbius |
| author_sort | Alexander Krivcov |
| collection | DOAJ |
| description | Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole–dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness. |
| first_indexed | 2024-12-21T19:47:05Z |
| format | Article |
| id | doaj.art-2787fa5527104e6bb62fda32edc5ad16 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-21T19:47:05Z |
| publishDate | 2019-05-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-2787fa5527104e6bb62fda32edc5ad162022-12-21T18:52:18ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862019-05-011011056106410.3762/bjnano.10.1062190-4286-10-106Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopyAlexander Krivcov0Jasmin Ehrler1Marc Fuhrmann2Tanja Junkers3Hildegard Möbius4Department of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, GermanyDepartment of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, GermanyDepartment of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, GermanyPolymer Reaction Design group, School of Chemistry, Monash University, Clayton VIC 3800, AustraliaDepartment of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, GermanyMagnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole–dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness.https://doi.org/10.3762/bjnano.10.106capacitive couplingelectrostatic effectsmagnetic force microscopynanoparticlessuperparamagnetic iron oxide nanoparticle (SPION) |
| spellingShingle | Alexander Krivcov Jasmin Ehrler Marc Fuhrmann Tanja Junkers Hildegard Möbius Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy Beilstein Journal of Nanotechnology capacitive coupling electrostatic effects magnetic force microscopy nanoparticles superparamagnetic iron oxide nanoparticle (SPION) |
| title | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| title_full | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| title_fullStr | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| title_full_unstemmed | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| title_short | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| title_sort | influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
| topic | capacitive coupling electrostatic effects magnetic force microscopy nanoparticles superparamagnetic iron oxide nanoparticle (SPION) |
| url | https://doi.org/10.3762/bjnano.10.106 |
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