An Efficient YOLO Algorithm with an Attention Mechanism for Vision-Based Defect Inspection Deployed on FPGA

An Efficient YOLO Algorithm with an Attention Mechanism for Vision-Based Defect Inspection Deployed on FPGA

Industry 4.0 features intelligent manufacturing. Among them, the vision-based defect inspection algorithm is remarkable for quality control in parts manufacturing. With the help of AI and machine learning, auto-adaptive instead of manual operation is achievable in this field, and much progress has b...

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Bibliographic Details
Main Authors: Longzhen Yu, Jianhua Zhu, Qian Zhao, Zhixian Wang
Format: Article
Language:English
Published: MDPI AG 2022-06-01
Series:Micromachines
Subjects:
vision
defect inspection
YOLO
FPGA
attention
Online Access:https://www.mdpi.com/2072-666X/13/7/1058

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