Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions
A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...
| প্রধান লেখক: | , , , , , |
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| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| প্রকাশিত: |
IEEE
2024-01-01
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| মালা: | IEEE Access |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://ieeexplore.ieee.org/document/10496103/ |