Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions
A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...
Príomhchruthaitheoirí: | Sergio Colangeli, Leonardo Pantoli, Walter Ciccognani, Patrick E. Longhi, Giorgio Leuzzi, Ernesto Limiti |
---|---|
Formáid: | Alt |
Teanga: | English |
Foilsithe / Cruthaithe: |
IEEE
2024-01-01
|
Sraith: | IEEE Access |
Ábhair: | |
Rochtain ar líne: | https://ieeexplore.ieee.org/document/10496103/ |
Míreanna comhchosúla
Míreanna comhchosúla
-
A Simple Test to Check the Inherent-Stability Proviso on Field-Effect Transistors
de réir: Sergio Colangeli, et al.
Foilsithe / Cruthaithe: (2018-01-01) -
Ka-Band High-Linearity and Low-Noise Gallium Nitride MMIC Amplifiers for Spaceborne Telecommunications
de réir: Patrick Ettore Longhi, et al.
Foilsithe / Cruthaithe: (2023-01-01) -
Nonlinear microwave circuit design /
de réir: Giannini, Franco, 1944-, et al.
Foilsithe / Cruthaithe: (2004) -
Ascertaining Operating Points of Harmonic Transponders Using Intermodulation Responses
de réir: Jeff Frolik, et al.
Foilsithe / Cruthaithe: (2024-01-01) -
Frequency-Domain Nonlinear Modeling Approaches for Power Systems Components—A Comparison
de réir: Marco Faifer, et al.
Foilsithe / Cruthaithe: (2020-05-01)