Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions

A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...

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Príomhchruthaitheoirí: Sergio Colangeli, Leonardo Pantoli, Walter Ciccognani, Patrick E. Longhi, Giorgio Leuzzi, Ernesto Limiti
Formáid: Alt
Teanga:English
Foilsithe / Cruthaithe: IEEE 2024-01-01
Sraith:IEEE Access
Ábhair:
Rochtain ar líne:https://ieeexplore.ieee.org/document/10496103/