Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions
A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...
| Main Authors: | , , , , , |
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| פורמט: | Article |
| שפה: | English |
| יצא לאור: |
IEEE
2024-01-01
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| סדרה: | IEEE Access |
| נושאים: | |
| גישה מקוונת: | https://ieeexplore.ieee.org/document/10496103/ |