Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions

A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Sergio Colangeli, Leonardo Pantoli, Walter Ciccognani, Patrick E. Longhi, Giorgio Leuzzi, Ernesto Limiti
स्वरूप: लेख
भाषा:English
प्रकाशित: IEEE 2024-01-01
श्रृंखला:IEEE Access
विषय:
ऑनलाइन पहुंच:https://ieeexplore.ieee.org/document/10496103/