Partitioned Ohtomo Stability Test for Efficient Analysis of Large-Signal Solutions
A fundamental step in the design of electronic circuits is the verification that they are stable at least on a given set of external terminations, in order to avoid that the solution found be not observable in practice. This is especially true at microwave and millimeter-wave circuits, which are typ...
| Main Authors: | , , , , , |
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| 格式: | Article |
| 語言: | English |
| 出版: |
IEEE
2024-01-01
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| 叢編: | IEEE Access |
| 主題: | |
| 在線閱讀: | https://ieeexplore.ieee.org/document/10496103/ |