A data-driven lifetime prediction method for thermal stress fatigue failure of power MOSFETs
As one of the core power electronic devices that undertake power conversion and control tasks in electrical systems, power MOSFETs are widely used in key fields such as transportation, industrial drives, and aerospace. At present, the traditional method improves the reliability of power electronic d...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2022-11-01
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| Series: | Energy Reports |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352484722020716 |