Electrical and photoelectric properties of heterostructures NiO/p-CdTe and NiO/n-CdTe

In this study, we investigate the electrical and photoelectric properties of heterostructures formed by the reactive magnetron sputtering of thin film NiO onto p-CdTe and n-CdTe substrates. The current-voltage characteristics of the heterojunctions were measured at room temperature. The dominating c...

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Bibliographic Details
Main Authors: Parkhomenko H. P., Maryanchuk P. D.
Format: Article
Language:English
Published: Politehperiodika 2016-10-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
Online Access:http://www.tkea.com.ua/tkea/2016/4-5_2016/pdf/04.pdf
Description
Summary:In this study, we investigate the electrical and photoelectric properties of heterostructures formed by the reactive magnetron sputtering of thin film NiO onto p-CdTe and n-CdTe substrates. The current-voltage characteristics of the heterojunctions were measured at room temperature. The dominating current transport mechanisms through the NiO/n-CdTe and NiO/p-CdTe heterojunctions at the forward biases are generation-recombination and tunnel, at the reverse biases is tunnel current transport mechanisms. The heterojunctions under investigation generate open-circuit voltage Uoc = 0.26 V and short-circuit current Isc = 58.7 μA/cm2 under illumination 80 mW/cm-2. The research results can be used for better understanding of the processes occurring in heterojunctions NiO/ n-CdTe and NiO/p-CdTe, to further improve their properties and parameters.
ISSN:2225-5818
2309-9992