TEM-EELS analyses of protactinium

TEM-EELS analyses of protactinium

A fragment of metallic protactinium (Pa) has been studied using a transmission electron microscope (TEM) equipped with an electron energy loss spectroscopy (EELS) detector. Bright and dark field TEM images have been acquired, and selective area electron diffraction (SAED) has been used to study the...

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Bibliographic Details
Main Authors: O Dieste, T Wiss, J-C Griveau, R J M Konings, G van der Laan, R Caciuffo
Format: Article
Language:English
Published: IOP Publishing 2018-01-01
Series:Materials Research Express
Subjects:
protactinium
EELS
TEM
electronic structure
Online Access:https://doi.org/10.1088/2053-1591/aaef23

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