New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection
This paper presents a new parametric fault detection (PFD) approach for testing of linear analog circuits. It combines classified frequency-bands with amplitude weighting for fault controllability and test-points selection for fault observability. The test waveform sweeps on an applicable frequency-...
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| Format: | Article |
| Language: | English |
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Elsevier
2021-06-01
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| Series: | Ain Shams Engineering Journal |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2090447920302276 |
| _version_ | 1819064016546299904 |
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| author | Bassam A. Abo-elftooh Mohamed H. El-Mahlawy Hani F. Ragai |
| author_facet | Bassam A. Abo-elftooh Mohamed H. El-Mahlawy Hani F. Ragai |
| author_sort | Bassam A. Abo-elftooh |
| collection | DOAJ |
| description | This paper presents a new parametric fault detection (PFD) approach for testing of linear analog circuits. It combines classified frequency-bands with amplitude weighting for fault controllability and test-points selection for fault observability. The test waveform sweeps on an applicable frequency-band instead of the whole band to stimulate parametric faults. The number of required samples is reduced, and the summation of samples from undesired bands is avoided. The test response is compacted for each band generating digital signature. The digital signature curve (DSC) is plotted for each component. A hybrid between MATLAB and PSPICE simulation is used to develop accurate worst case analysis (WCA). The relation between the classified DSC and the accurate WCA results in the enhanced PFD. It is found that the weighted sweeping-sinusoidal waveform is the best selection. The presented approach is applied to different linear analog benchmark circuits and shows the significant PFD improvement compared to previously published works. |
| first_indexed | 2024-12-21T15:23:52Z |
| format | Article |
| id | doaj.art-2cf3961828c34570b60a36e3957d6e0b |
| institution | Directory Open Access Journal |
| issn | 2090-4479 |
| language | English |
| last_indexed | 2024-12-21T15:23:52Z |
| publishDate | 2021-06-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Ain Shams Engineering Journal |
| spelling | doaj.art-2cf3961828c34570b60a36e3957d6e0b2022-12-21T18:58:57ZengElsevierAin Shams Engineering Journal2090-44792021-06-0112217011721New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selectionBassam A. Abo-elftooh0Mohamed H. El-Mahlawy1Hani F. Ragai2Electronics and Communication Engineering Dep, Faculty of Engineering Sciences & Arts, Misr International University, Cairo, Egypt; Corresponding author.Electrical Engineering Dep., Faculty of Engineering and Technology, Future University in Egypt, Cairo, EgyptIC Lab, Faculty of Engineering, Ain Shams University, Cairo, EgyptThis paper presents a new parametric fault detection (PFD) approach for testing of linear analog circuits. It combines classified frequency-bands with amplitude weighting for fault controllability and test-points selection for fault observability. The test waveform sweeps on an applicable frequency-band instead of the whole band to stimulate parametric faults. The number of required samples is reduced, and the summation of samples from undesired bands is avoided. The test response is compacted for each band generating digital signature. The digital signature curve (DSC) is plotted for each component. A hybrid between MATLAB and PSPICE simulation is used to develop accurate worst case analysis (WCA). The relation between the classified DSC and the accurate WCA results in the enhanced PFD. It is found that the weighted sweeping-sinusoidal waveform is the best selection. The presented approach is applied to different linear analog benchmark circuits and shows the significant PFD improvement compared to previously published works.http://www.sciencedirect.com/science/article/pii/S2090447920302276Digital testing of analog circuitsTesting of analog circuitsClassification of frequency-bandsFault detection for parametric faultsSelection of test-points |
| spellingShingle | Bassam A. Abo-elftooh Mohamed H. El-Mahlawy Hani F. Ragai New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection Ain Shams Engineering Journal Digital testing of analog circuits Testing of analog circuits Classification of frequency-bands Fault detection for parametric faults Selection of test-points |
| title | New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection |
| title_full | New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection |
| title_fullStr | New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection |
| title_full_unstemmed | New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection |
| title_short | New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection |
| title_sort | new digital testing for parametric fault detection in analog circuits using classified frequency bands and efficient test point selection |
| topic | Digital testing of analog circuits Testing of analog circuits Classification of frequency-bands Fault detection for parametric faults Selection of test-points |
| url | http://www.sciencedirect.com/science/article/pii/S2090447920302276 |
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