Time-resolved single dopant charge dynamics in silicon
Probing individual impurities will become increasingly important as devices shrink towards the nanoscale. Here Rashidi et al., introduce a method based on time-resolved scanning tunnelling spectroscopy of surface dangling bonds to investigate the dynamics of individual dopants in silicon.
Main Authors: | , , , , , , |
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Format: | Article |
Language: | English |
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Nature Portfolio
2016-10-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/ncomms13258 |
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author | Mohammad Rashidi Jacob A. J. Burgess Marco Taucer Roshan Achal Jason L. Pitters Sebastian Loth Robert A. Wolkow |
author_facet | Mohammad Rashidi Jacob A. J. Burgess Marco Taucer Roshan Achal Jason L. Pitters Sebastian Loth Robert A. Wolkow |
author_sort | Mohammad Rashidi |
collection | DOAJ |
description | Probing individual impurities will become increasingly important as devices shrink towards the nanoscale. Here Rashidi et al., introduce a method based on time-resolved scanning tunnelling spectroscopy of surface dangling bonds to investigate the dynamics of individual dopants in silicon. |
first_indexed | 2024-12-20T16:36:53Z |
format | Article |
id | doaj.art-2d1bb8e3bd82405f904f9b1186ba6e60 |
institution | Directory Open Access Journal |
issn | 2041-1723 |
language | English |
last_indexed | 2024-12-20T16:36:53Z |
publishDate | 2016-10-01 |
publisher | Nature Portfolio |
record_format | Article |
series | Nature Communications |
spelling | doaj.art-2d1bb8e3bd82405f904f9b1186ba6e602022-12-21T19:33:08ZengNature PortfolioNature Communications2041-17232016-10-01711710.1038/ncomms13258Time-resolved single dopant charge dynamics in siliconMohammad Rashidi0Jacob A. J. Burgess1Marco Taucer2Roshan Achal3Jason L. Pitters4Sebastian Loth5Robert A. Wolkow6Department of Physics, University of AlbertaMax Planck Institute for the Structure and Dynamics of MatterDepartment of Physics, University of AlbertaDepartment of Physics, University of AlbertaNational Institute for Nanotechnology, National Research Council of CanadaMax Planck Institute for the Structure and Dynamics of MatterDepartment of Physics, University of AlbertaProbing individual impurities will become increasingly important as devices shrink towards the nanoscale. Here Rashidi et al., introduce a method based on time-resolved scanning tunnelling spectroscopy of surface dangling bonds to investigate the dynamics of individual dopants in silicon.https://doi.org/10.1038/ncomms13258 |
spellingShingle | Mohammad Rashidi Jacob A. J. Burgess Marco Taucer Roshan Achal Jason L. Pitters Sebastian Loth Robert A. Wolkow Time-resolved single dopant charge dynamics in silicon Nature Communications |
title | Time-resolved single dopant charge dynamics in silicon |
title_full | Time-resolved single dopant charge dynamics in silicon |
title_fullStr | Time-resolved single dopant charge dynamics in silicon |
title_full_unstemmed | Time-resolved single dopant charge dynamics in silicon |
title_short | Time-resolved single dopant charge dynamics in silicon |
title_sort | time resolved single dopant charge dynamics in silicon |
url | https://doi.org/10.1038/ncomms13258 |
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