Performance Analysis of Bus Voltage in Distribution Network with High Penetration of PV Controlled via Data-Driven Approach

Integration of large-scale distributed photovoltaic (PV) generation resources can lead to technical challenges, particularly voltage rise caused by PVs power injection at the time of high solar radiation profile and low load demand. Reactive power control of PV inverters can help mitigate the voltag...

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Bibliographic Details
Main Authors: Anju Yadav, Nand Kishor, Richa Negi, Mikael Opas, Petra Raussi
Format: Article
Language:English
Published: Wiley 2023-01-01
Series:International Transactions on Electrical Energy Systems
Online Access:http://dx.doi.org/10.1155/2023/3708751
Description
Summary:Integration of large-scale distributed photovoltaic (PV) generation resources can lead to technical challenges, particularly voltage rise caused by PVs power injection at the time of high solar radiation profile and low load demand. Reactive power control of PV inverters can help mitigate the voltage rise, which arises just for a short duration due to high incident solar radiation. There is a possibility to control functions on these PV inverters based on the rating of the PV inverter. For one-second resolution, local data-driven voltage sensitivity estimation is applied to update the control functions such as volt-var and volt-watt on the PV inverters so as to regulate the bus voltage. Different forms of solar radiation profiles, transient varying, smooth varying, and worst operating scenario corresponding to the minimum load at the time of high PV generation, are included. The study is demonstrated for different PV penetration levels. The voltage analysis on buses is performed using power hardware (PV emulator) in the loop simulation, at one of the buses in the network, while the remaining PVs are being controlled using volt-var control (VVC)/volt-watt control (VWC) methods. The applied approach confirms to maintaining bus voltage within limits even against a very short transient time instant of solar radiation profile.
ISSN:2050-7038