Silicon Nitride Background in Nanophotonic Waveguide Enhanced Raman Spectroscopy

Silicon Nitride Background in Nanophotonic Waveguide Enhanced Raman Spectroscopy

Recent studies have shown that evanescent Raman spectroscopy using a silicon nitride (SiN) nanophotonic waveguide platform has higher signal enhancement when compared to free-space systems. However, signal-to-noise ratio from the waveguide at a low analyte concentration is constrained by the shot-no...

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Bibliographic Details
Main Authors:	Ashim Dhakal, Pieter Wuytens, Ali Raza, Nicolas Le Thomas, Roel Baets
Format:	Article
Language:	English
Published:	MDPI AG 2017-02-01
Series:	Materials
Subjects:	integrated optics Raman spectroscopy optical sensing and sensors silicon nitride dielectric channel waveguides background shot noise
Online Access:	http://www.mdpi.com/1996-1944/10/2/140

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