Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing
Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Th...
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-12-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/21/1/8 |
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| author | Adrian Zakrzewski Piotr Jurewicz Michał Ćwikła Piotr Koruba Jacek Reiner |
| author_facet | Adrian Zakrzewski Piotr Jurewicz Michał Ćwikła Piotr Koruba Jacek Reiner |
| author_sort | Adrian Zakrzewski |
| collection | DOAJ |
| description | Imaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Therefore, we propose an approach for reconstruction of the reflection distribution based on a series of measurements at different illumination angles and extrapolation of the missing results to overcome this limitation. The developed algorithm was validated using bidirectional transmittance distribution function (BTDF) measurements. The BRDF measurements were carried out for materials that are commonly used in laser material processing, i.e. substrates and functional coatings. The obtained data were subsequently used to determine the total reflection intensity from all considered materials, which were characterized by reconstructed distributions. |
| first_indexed | 2024-03-10T13:52:04Z |
| format | Article |
| id | doaj.art-2ee8ee6bb7014fdeb43bbac91bc797cd |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-10T13:52:04Z |
| publishDate | 2020-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-2ee8ee6bb7014fdeb43bbac91bc797cd2023-11-21T02:01:46ZengMDPI AGSensors1424-82202020-12-01211810.3390/s21010008Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material ProcessingAdrian Zakrzewski0Piotr Jurewicz1Michał Ćwikła2Piotr Koruba3Jacek Reiner4Faculty of Mechanical Engineering, Wrocław University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, 50-370 Wrocław, PolandFaculty of Mechanical Engineering, Wrocław University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, 50-370 Wrocław, PolandFaculty of Mechanical Engineering, Wrocław University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, 50-370 Wrocław, PolandFaculty of Mechanical Engineering, Wrocław University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, 50-370 Wrocław, PolandFaculty of Mechanical Engineering, Wrocław University of Science and Technology, Wybrzeże Stanisława Wyspiańskiego 27, 50-370 Wrocław, PolandImaging scatterometry is a method for determining the reflection distribution based on bidirectional reflectance distribution function (BRDF) measurements. However, it has a well-known limitation that results obtained by imaging scatterometry for small illumination angles are practically useless. Therefore, we propose an approach for reconstruction of the reflection distribution based on a series of measurements at different illumination angles and extrapolation of the missing results to overcome this limitation. The developed algorithm was validated using bidirectional transmittance distribution function (BTDF) measurements. The BRDF measurements were carried out for materials that are commonly used in laser material processing, i.e. substrates and functional coatings. The obtained data were subsequently used to determine the total reflection intensity from all considered materials, which were characterized by reconstructed distributions.https://www.mdpi.com/1424-8220/21/1/8imaging scatterometryBRDF reconstructionreflection distribution |
| spellingShingle | Adrian Zakrzewski Piotr Jurewicz Michał Ćwikła Piotr Koruba Jacek Reiner Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing Sensors imaging scatterometry BRDF reconstruction reflection distribution |
| title | Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing |
| title_full | Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing |
| title_fullStr | Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing |
| title_full_unstemmed | Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing |
| title_short | Imaging Scatterometry with Extrapolation of Missing BRDF Data for Materials Used in Laser Material Processing |
| title_sort | imaging scatterometry with extrapolation of missing brdf data for materials used in laser material processing |
| topic | imaging scatterometry BRDF reconstruction reflection distribution |
| url | https://www.mdpi.com/1424-8220/21/1/8 |
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