Measuring the Flex Life of Conductive Yarns in Narrow Fabric
Due to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-03-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/14/4/781 |
| _version_ | 1797604295113179136 |
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| author | Paula Veske Frederick Bossuyt Filip Thielemans Jan Vanfleteren |
| author_facet | Paula Veske Frederick Bossuyt Filip Thielemans Jan Vanfleteren |
| author_sort | Paula Veske |
| collection | DOAJ |
| description | Due to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster around transition areas than other parts of e-textile systems. Thus, the current work aims to find the limits of two conductive yarns woven into a narrow fabric at the electronics encapsulation transition point. The tests consisted of repeated bending and mechanical stress, and were conducted using a testing machine built from off-the-shelf components. The electronics were encapsulated with an injection-moulded potting compound. In addition to identifying the most reliable conductive yarn and soft–rigid transition materials, the results examined the failure process during the bending tests, including continuous electrical measurements. |
| first_indexed | 2024-03-11T04:44:23Z |
| format | Article |
| id | doaj.art-2f1fef3aac584fc8b74446cf068c465d |
| institution | Directory Open Access Journal |
| issn | 2072-666X |
| language | English |
| last_indexed | 2024-03-11T04:44:23Z |
| publishDate | 2023-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Micromachines |
| spelling | doaj.art-2f1fef3aac584fc8b74446cf068c465d2023-11-17T20:29:16ZengMDPI AGMicromachines2072-666X2023-03-0114478110.3390/mi14040781Measuring the Flex Life of Conductive Yarns in Narrow FabricPaula Veske0Frederick Bossuyt1Filip Thielemans2Jan Vanfleteren3Centre for Microsystems Technology (CMST), Interuniversity Microelectronics Centre (IMEC), Ghent University, 9000 Ghent, BelgiumCentre for Microsystems Technology (CMST), Interuniversity Microelectronics Centre (IMEC), Ghent University, 9000 Ghent, BelgiumCentre for Microsystems Technology (CMST), Interuniversity Microelectronics Centre (IMEC), Ghent University, 9000 Ghent, BelgiumCentre for Microsystems Technology (CMST), Interuniversity Microelectronics Centre (IMEC), Ghent University, 9000 Ghent, BelgiumDue to constant advancements in materials research, conductive textile-based materials have been used increasingly in textile-based wearables. However, due to the rigidity of electronics or the need for their encapsulation, conductive textile materials, such as conductive yarns, tend to break faster around transition areas than other parts of e-textile systems. Thus, the current work aims to find the limits of two conductive yarns woven into a narrow fabric at the electronics encapsulation transition point. The tests consisted of repeated bending and mechanical stress, and were conducted using a testing machine built from off-the-shelf components. The electronics were encapsulated with an injection-moulded potting compound. In addition to identifying the most reliable conductive yarn and soft–rigid transition materials, the results examined the failure process during the bending tests, including continuous electrical measurements.https://www.mdpi.com/2072-666X/14/4/781wearablese-textileselectronicstestingreliability |
| spellingShingle | Paula Veske Frederick Bossuyt Filip Thielemans Jan Vanfleteren Measuring the Flex Life of Conductive Yarns in Narrow Fabric Micromachines wearables e-textiles electronics testing reliability |
| title | Measuring the Flex Life of Conductive Yarns in Narrow Fabric |
| title_full | Measuring the Flex Life of Conductive Yarns in Narrow Fabric |
| title_fullStr | Measuring the Flex Life of Conductive Yarns in Narrow Fabric |
| title_full_unstemmed | Measuring the Flex Life of Conductive Yarns in Narrow Fabric |
| title_short | Measuring the Flex Life of Conductive Yarns in Narrow Fabric |
| title_sort | measuring the flex life of conductive yarns in narrow fabric |
| topic | wearables e-textiles electronics testing reliability |
| url | https://www.mdpi.com/2072-666X/14/4/781 |
| work_keys_str_mv | AT paulaveske measuringtheflexlifeofconductiveyarnsinnarrowfabric AT frederickbossuyt measuringtheflexlifeofconductiveyarnsinnarrowfabric AT filipthielemans measuringtheflexlifeofconductiveyarnsinnarrowfabric AT janvanfleteren measuringtheflexlifeofconductiveyarnsinnarrowfabric |