Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method
Monolithic integrated μLED optrode has promising applications in optogenetics due to their ability to achieve more optical channels in a smaller footprint. The current used to drive the μLED will cause electromagnetic interference (EMI) noise to the recording electrodes at a very close distance. Uti...
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| Language: | English |
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Frontiers Media S.A.
2021-12-01
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| Series: | Frontiers in Nanotechnology |
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| Online Access: | https://www.frontiersin.org/articles/10.3389/fnano.2021.758484/full |
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| author | Yang Wang Yang Wang Yamin Li Yamin Li Xiaowei Yang Xiaoting Wu Xiaoting Wu Yijun Wang Yijun Wang Weihua Pei Weihua Pei Weihua Pei |
| author_facet | Yang Wang Yang Wang Yamin Li Yamin Li Xiaowei Yang Xiaoting Wu Xiaoting Wu Yijun Wang Yijun Wang Weihua Pei Weihua Pei Weihua Pei |
| author_sort | Yang Wang |
| collection | DOAJ |
| description | Monolithic integrated μLED optrode has promising applications in optogenetics due to their ability to achieve more optical channels in a smaller footprint. The current used to drive the μLED will cause electromagnetic interference (EMI) noise to the recording electrodes at a very close distance. Utilizing a grounded metal shielding layer between the active device and the electrode can potentially reduce the interference. In this paper, multi-dimensional μLED optrode models are set up according to the real device. By numerically analyzing the electromagnetic interference between the μLED and recording electrodes, several optimized shielding schemes are evaluated by simulations and experiments. Some important process and layout parameters that may influence the shielding effect are studied through the finite element method (FEM). Different circuit models based on the corresponding test environment are built to analyze the simulation and experiment results. A new PCB with a shielding layer has been designed and initially verified. The proposed novel computational model can analyze EMI quantitatively, which could facilitate the design of low-noise μLED optrode with reasonable shielding and packaging. |
| first_indexed | 2024-12-17T13:28:41Z |
| format | Article |
| id | doaj.art-2fcaeebea35545bdb10921ee2b5aafc9 |
| institution | Directory Open Access Journal |
| issn | 2673-3013 |
| language | English |
| last_indexed | 2024-12-17T13:28:41Z |
| publishDate | 2021-12-01 |
| publisher | Frontiers Media S.A. |
| record_format | Article |
| series | Frontiers in Nanotechnology |
| spelling | doaj.art-2fcaeebea35545bdb10921ee2b5aafc92022-12-21T21:46:39ZengFrontiers Media S.A.Frontiers in Nanotechnology2673-30132021-12-01310.3389/fnano.2021.758484758484Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element MethodYang Wang0Yang Wang1Yamin Li2Yamin Li3Xiaowei Yang4Xiaoting Wu5Xiaoting Wu6Yijun Wang7Yijun Wang8Weihua Pei9Weihua Pei10Weihua Pei11State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, ChinaState Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, ChinaCAS Center for Excellence in Brain Science and Intelligence Technology, Shanghai, ChinaMonolithic integrated μLED optrode has promising applications in optogenetics due to their ability to achieve more optical channels in a smaller footprint. The current used to drive the μLED will cause electromagnetic interference (EMI) noise to the recording electrodes at a very close distance. Utilizing a grounded metal shielding layer between the active device and the electrode can potentially reduce the interference. In this paper, multi-dimensional μLED optrode models are set up according to the real device. By numerically analyzing the electromagnetic interference between the μLED and recording electrodes, several optimized shielding schemes are evaluated by simulations and experiments. Some important process and layout parameters that may influence the shielding effect are studied through the finite element method (FEM). Different circuit models based on the corresponding test environment are built to analyze the simulation and experiment results. A new PCB with a shielding layer has been designed and initially verified. The proposed novel computational model can analyze EMI quantitatively, which could facilitate the design of low-noise μLED optrode with reasonable shielding and packaging.https://www.frontiersin.org/articles/10.3389/fnano.2021.758484/fullμLED optrodeelectromagnetic interferenceelectromagnetic shieldingoptogeneticsfinite element method |
| spellingShingle | Yang Wang Yang Wang Yamin Li Yamin Li Xiaowei Yang Xiaoting Wu Xiaoting Wu Yijun Wang Yijun Wang Weihua Pei Weihua Pei Weihua Pei Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method Frontiers in Nanotechnology μLED optrode electromagnetic interference electromagnetic shielding optogenetics finite element method |
| title | Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method |
| title_full | Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method |
| title_fullStr | Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method |
| title_full_unstemmed | Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method |
| title_short | Analysis of Electromagnetic Interference and Shielding in the μLED Optrode Based on Finite Element Method |
| title_sort | analysis of electromagnetic interference and shielding in the μled optrode based on finite element method |
| topic | μLED optrode electromagnetic interference electromagnetic shielding optogenetics finite element method |
| url | https://www.frontiersin.org/articles/10.3389/fnano.2021.758484/full |
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