Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging
We report near- and far-field computer simulations of synchrotron X-ray phase-contrast images using a micropipe in a SiC crystal as a model system. Experimental images illustrate the theoretical results. The properties of nearly perfect single crystals of silicon carbide are strongly affected by μm-...
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MDPI AG
2022-01-01
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| Online Access: | https://www.mdpi.com/1996-1944/15/3/856 |
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| author | Tatiana S. Argunova Victor G. Kohn |
| author_facet | Tatiana S. Argunova Victor G. Kohn |
| author_sort | Tatiana S. Argunova |
| collection | DOAJ |
| description | We report near- and far-field computer simulations of synchrotron X-ray phase-contrast images using a micropipe in a SiC crystal as a model system. Experimental images illustrate the theoretical results. The properties of nearly perfect single crystals of silicon carbide are strongly affected by μm-sized pores even if their distribution in a crystal bulk is sparse. A non-destructive technique to reveal the pores is in-line phase-contrast imaging with synchrotron radiation. A quantitative approach to evaluating pore sizes is the use of computer simulations of phase-contrast images. It was found that near-field phase-contrast images are formed at very short distances behind a sample. We estimated these distances for tiny pores. The Fresnel zones did not provide any information on the pore size in the far-field, but a contrast value within the first Fresnel zone could be used for simulations. Finally, general problems in evaluating a micro-pore size via image analysis are discussed. |
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| format | Article |
| id | doaj.art-3064ed58882643a59862111cd62d778f |
| institution | Directory Open Access Journal |
| issn | 1996-1944 |
| language | English |
| last_indexed | 2024-03-09T23:36:49Z |
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| series | Materials |
| spelling | doaj.art-3064ed58882643a59862111cd62d778f2023-11-23T16:58:12ZengMDPI AGMaterials1996-19442022-01-0115385610.3390/ma15030856Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast ImagingTatiana S. Argunova0Victor G. Kohn1Ioffe Institute of the Russian Academy of Sciences, Polytekhnicheskaya st. 26, 194021 St. Petersburg, RussiaNational Research Centre ‘Kurchatov Institute’, Kurchatov sqr., 1, 123182 Moscow, RussiaWe report near- and far-field computer simulations of synchrotron X-ray phase-contrast images using a micropipe in a SiC crystal as a model system. Experimental images illustrate the theoretical results. The properties of nearly perfect single crystals of silicon carbide are strongly affected by μm-sized pores even if their distribution in a crystal bulk is sparse. A non-destructive technique to reveal the pores is in-line phase-contrast imaging with synchrotron radiation. A quantitative approach to evaluating pore sizes is the use of computer simulations of phase-contrast images. It was found that near-field phase-contrast images are formed at very short distances behind a sample. We estimated these distances for tiny pores. The Fresnel zones did not provide any information on the pore size in the far-field, but a contrast value within the first Fresnel zone could be used for simulations. Finally, general problems in evaluating a micro-pore size via image analysis are discussed.https://www.mdpi.com/1996-1944/15/3/856micro-pores in single crystalsX-ray imagingphase contrastsynchrotron radiation |
| spellingShingle | Tatiana S. Argunova Victor G. Kohn Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging Materials micro-pores in single crystals X-ray imaging phase contrast synchrotron radiation |
| title | Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging |
| title_full | Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging |
| title_fullStr | Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging |
| title_full_unstemmed | Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging |
| title_short | Problems with Evaluation of Micro-Pore Size in Silicon Carbide Using Synchrotron X-ray Phase Contrast Imaging |
| title_sort | problems with evaluation of micro pore size in silicon carbide using synchrotron x ray phase contrast imaging |
| topic | micro-pores in single crystals X-ray imaging phase contrast synchrotron radiation |
| url | https://www.mdpi.com/1996-1944/15/3/856 |
| work_keys_str_mv | AT tatianasargunova problemswithevaluationofmicroporesizeinsiliconcarbideusingsynchrotronxrayphasecontrastimaging AT victorgkohn problemswithevaluationofmicroporesizeinsiliconcarbideusingsynchrotronxrayphasecontrastimaging |