Multi-CC: A New Baseline for Faster and Better Deep Clustering
The aim of our paper is to introduce a new deep clustering model called Multi-head Cross-Attention Contrastive Clustering (Multi-CC), which seeks to enhance the performance of the existing deep clustering model CC. Our approach involves first augmenting the data to form image pairs and then using th...
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MDPI AG
2023-10-01
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Series: | Electronics |
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Online Access: | https://www.mdpi.com/2079-9292/12/20/4204 |
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author | Yulin Yao Yu Yang Linna Zhou Xinsheng Guo Gang Wang |
author_facet | Yulin Yao Yu Yang Linna Zhou Xinsheng Guo Gang Wang |
author_sort | Yulin Yao |
collection | DOAJ |
description | The aim of our paper is to introduce a new deep clustering model called Multi-head Cross-Attention Contrastive Clustering (Multi-CC), which seeks to enhance the performance of the existing deep clustering model CC. Our approach involves first augmenting the data to form image pairs and then using the same backbone to extract the feature representation of these image pairs. We then undertake contrastive learning, separately in the row space and column space of the feature matrix, to jointly learn the instance and cluster representations. Our approach offers several key improvements over the existing model. Firstly, we use a mixed strategy of strong and weak augmentation to construct image pairs. Secondly, we get rid of the pooling layer of the backbone to prevent loss of information. Finally, we introduce a multi-head cross-attention module to improve the model’s performance. These improvements have allowed us to reduce the model training time by 80%. As a baseline, Multi-CC achieves the best results on CIFAR-10, ImageNet-10, and ImageNet-dogs. It is easily replaceable with CC, making models based on CC achieve better performance. |
first_indexed | 2024-03-10T21:17:20Z |
format | Article |
id | doaj.art-30c97e8248344c92afee999178a4416e |
institution | Directory Open Access Journal |
issn | 2079-9292 |
language | English |
last_indexed | 2024-03-10T21:17:20Z |
publishDate | 2023-10-01 |
publisher | MDPI AG |
record_format | Article |
series | Electronics |
spelling | doaj.art-30c97e8248344c92afee999178a4416e2023-11-19T16:18:18ZengMDPI AGElectronics2079-92922023-10-011220420410.3390/electronics12204204Multi-CC: A New Baseline for Faster and Better Deep ClusteringYulin Yao0Yu Yang1Linna Zhou2Xinsheng Guo3Gang Wang4School of Cyberspace Security, Beijing University of Posts and Telecommunications, Beijing 100876, ChinaSchool of Cyberspace Security, Beijing University of Posts and Telecommunications, Beijing 100876, ChinaSchool of Cyberspace Security, Beijing University of Posts and Telecommunications, Beijing 100876, ChinaSchool of Cyberspace Security, Beijing University of Posts and Telecommunications, Beijing 100876, ChinaIntelligent Policing Key Laboratory of Sichuan Province, Sichuan Police College, Luzhou 646000, ChinaThe aim of our paper is to introduce a new deep clustering model called Multi-head Cross-Attention Contrastive Clustering (Multi-CC), which seeks to enhance the performance of the existing deep clustering model CC. Our approach involves first augmenting the data to form image pairs and then using the same backbone to extract the feature representation of these image pairs. We then undertake contrastive learning, separately in the row space and column space of the feature matrix, to jointly learn the instance and cluster representations. Our approach offers several key improvements over the existing model. Firstly, we use a mixed strategy of strong and weak augmentation to construct image pairs. Secondly, we get rid of the pooling layer of the backbone to prevent loss of information. Finally, we introduce a multi-head cross-attention module to improve the model’s performance. These improvements have allowed us to reduce the model training time by 80%. As a baseline, Multi-CC achieves the best results on CIFAR-10, ImageNet-10, and ImageNet-dogs. It is easily replaceable with CC, making models based on CC achieve better performance.https://www.mdpi.com/2079-9292/12/20/4204clusteringdeep clusteringcontrastive learning |
spellingShingle | Yulin Yao Yu Yang Linna Zhou Xinsheng Guo Gang Wang Multi-CC: A New Baseline for Faster and Better Deep Clustering Electronics clustering deep clustering contrastive learning |
title | Multi-CC: A New Baseline for Faster and Better Deep Clustering |
title_full | Multi-CC: A New Baseline for Faster and Better Deep Clustering |
title_fullStr | Multi-CC: A New Baseline for Faster and Better Deep Clustering |
title_full_unstemmed | Multi-CC: A New Baseline for Faster and Better Deep Clustering |
title_short | Multi-CC: A New Baseline for Faster and Better Deep Clustering |
title_sort | multi cc a new baseline for faster and better deep clustering |
topic | clustering deep clustering contrastive learning |
url | https://www.mdpi.com/2079-9292/12/20/4204 |
work_keys_str_mv | AT yulinyao multiccanewbaselineforfasterandbetterdeepclustering AT yuyang multiccanewbaselineforfasterandbetterdeepclustering AT linnazhou multiccanewbaselineforfasterandbetterdeepclustering AT xinshengguo multiccanewbaselineforfasterandbetterdeepclustering AT gangwang multiccanewbaselineforfasterandbetterdeepclustering |