Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission
Abstract Optical properties of single emitters can be significantly improved through the interaction with plasmonic structures, leading to enhanced sensing and imaging capabilities. In turn, single emitters can act as sensitive probes of the local electromagnetic field surrounding plasmonic structur...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Nature Publishing Group
2023-09-01
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| Series: | Light: Science & Applications |
| Online Access: | https://doi.org/10.1038/s41377-023-01237-9 |
| _version_ | 1797451392626982912 |
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| author | Gwiyeong Moon Taehwang Son Hajun Yoo Changhun Lee Hyunwoong Lee Seongmin Im Donghyun Kim |
| author_facet | Gwiyeong Moon Taehwang Son Hajun Yoo Changhun Lee Hyunwoong Lee Seongmin Im Donghyun Kim |
| author_sort | Gwiyeong Moon |
| collection | DOAJ |
| description | Abstract Optical properties of single emitters can be significantly improved through the interaction with plasmonic structures, leading to enhanced sensing and imaging capabilities. In turn, single emitters can act as sensitive probes of the local electromagnetic field surrounding plasmonic structures, furnishing fundamental insights into their physics and guiding the design of novel plasmonic devices. However, the interaction of emitters in the proximity to a plasmonic nanostructure causes distortion, which hinders precise estimation of position and polarization state and is one of the reasons why detection and quantification of molecular processes yet remain fundamentally challenging in this era of super-resolution. Here, we investigate axially defocused images of a single fluorescent emitter near metallic nanostructure, which encode emitter positions and can be acquired in the far-field with high sensitivity, while analyzing the images with pattern matching algorithm to explore emitter-localized surface plasmon interaction and retrieve information regarding emitter positions. Significant distortion in defocused images of fluorescent beads and quantum dots near nanostructure was observed and analyzed by pattern matching and finite-difference time-domain methods, which revealed that the distortion arises from the emitter interaction with nanostructure. Pattern matching algorithm was also adopted to estimate the lateral positions of a dipole that models an emitter utilizing the distorted defocused images and achieved improvement by more than 3 times over conventional diffraction-limited localization methods. The improvement by defocused imaging is expected to provide a way of enhancing reliability when using plasmonic nanostructure and diversifying strategies for various imaging and sensing modalities. |
| first_indexed | 2024-03-09T14:54:00Z |
| format | Article |
| id | doaj.art-30f1ab0948654ab3835853c7dffbc03b |
| institution | Directory Open Access Journal |
| issn | 2047-7538 |
| language | English |
| last_indexed | 2024-03-09T14:54:00Z |
| publishDate | 2023-09-01 |
| publisher | Nature Publishing Group |
| record_format | Article |
| series | Light: Science & Applications |
| spelling | doaj.art-30f1ab0948654ab3835853c7dffbc03b2023-11-26T14:17:18ZengNature Publishing GroupLight: Science & Applications2047-75382023-09-0112111210.1038/s41377-023-01237-9Defocused imaging-based quantification of plasmon-induced distortion of single emitter emissionGwiyeong Moon0Taehwang Son1Hajun Yoo2Changhun Lee3Hyunwoong Lee4Seongmin Im5Donghyun Kim6School of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversitySchool of Electrical and Electronic Engineering, Yonsei UniversityAbstract Optical properties of single emitters can be significantly improved through the interaction with plasmonic structures, leading to enhanced sensing and imaging capabilities. In turn, single emitters can act as sensitive probes of the local electromagnetic field surrounding plasmonic structures, furnishing fundamental insights into their physics and guiding the design of novel plasmonic devices. However, the interaction of emitters in the proximity to a plasmonic nanostructure causes distortion, which hinders precise estimation of position and polarization state and is one of the reasons why detection and quantification of molecular processes yet remain fundamentally challenging in this era of super-resolution. Here, we investigate axially defocused images of a single fluorescent emitter near metallic nanostructure, which encode emitter positions and can be acquired in the far-field with high sensitivity, while analyzing the images with pattern matching algorithm to explore emitter-localized surface plasmon interaction and retrieve information regarding emitter positions. Significant distortion in defocused images of fluorescent beads and quantum dots near nanostructure was observed and analyzed by pattern matching and finite-difference time-domain methods, which revealed that the distortion arises from the emitter interaction with nanostructure. Pattern matching algorithm was also adopted to estimate the lateral positions of a dipole that models an emitter utilizing the distorted defocused images and achieved improvement by more than 3 times over conventional diffraction-limited localization methods. The improvement by defocused imaging is expected to provide a way of enhancing reliability when using plasmonic nanostructure and diversifying strategies for various imaging and sensing modalities.https://doi.org/10.1038/s41377-023-01237-9 |
| spellingShingle | Gwiyeong Moon Taehwang Son Hajun Yoo Changhun Lee Hyunwoong Lee Seongmin Im Donghyun Kim Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission Light: Science & Applications |
| title | Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission |
| title_full | Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission |
| title_fullStr | Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission |
| title_full_unstemmed | Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission |
| title_short | Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission |
| title_sort | defocused imaging based quantification of plasmon induced distortion of single emitter emission |
| url | https://doi.org/10.1038/s41377-023-01237-9 |
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