Structural analysis of LaVO3 thin films under epitaxial strain
Rare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 for LaVO3) and the smaller one comes from inter-site d-o...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2018-04-01
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| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/1.5021844 |
| _version_ | 1818932488467120128 |
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| author | H. Meley Karandeep L. Oberson J. de Bruijckere D. T. L. Alexander J.-M. Triscone Ph. Ghosez S. Gariglio |
| author_facet | H. Meley Karandeep L. Oberson J. de Bruijckere D. T. L. Alexander J.-M. Triscone Ph. Ghosez S. Gariglio |
| author_sort | H. Meley |
| collection | DOAJ |
| description | Rare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 for LaVO3) and the smaller one comes from inter-site d-orbital interactions manifesting as a cooperative Jahn-Teller effect. Epitaxial strain acts on octahedral rotations and crystal field symmetry to alter this complex lattice-orbit coupling. In this study, LaVO3 thin film structures have been investigated by X-ray diffraction and scanning transmission electron microscopy. The analysis shows two different orientations of octahedral tilt patterns, as well as two distinct temperature behaviors, for compressive and tensile film strain states. Ab initio calculations capture the strain effect on the tilt pattern orientation in agreement with experimental data. |
| first_indexed | 2024-12-20T04:33:17Z |
| format | Article |
| id | doaj.art-318db3d2374749659720a4b3b569ab1f |
| institution | Directory Open Access Journal |
| issn | 2166-532X |
| language | English |
| last_indexed | 2024-12-20T04:33:17Z |
| publishDate | 2018-04-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | APL Materials |
| spelling | doaj.art-318db3d2374749659720a4b3b569ab1f2022-12-21T19:53:19ZengAIP Publishing LLCAPL Materials2166-532X2018-04-0164046102046102-910.1063/1.5021844007803APMStructural analysis of LaVO3 thin films under epitaxial strainH. Meley0Karandeep1L. Oberson2J. de Bruijckere3D. T. L. Alexander4J.-M. Triscone5Ph. Ghosez6S. Gariglio7DQMP, University of Geneva, 24 Quai E.-Ansermet, CH-1211 Geneva, SwitzerlandPhysique Théorique des Matériaux, Université de Liège (B5), B-4000 Liège, BelgiumInterdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, SwitzerlandDQMP, University of Geneva, 24 Quai E.-Ansermet, CH-1211 Geneva, SwitzerlandInterdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, SwitzerlandDQMP, University of Geneva, 24 Quai E.-Ansermet, CH-1211 Geneva, SwitzerlandPhysique Théorique des Matériaux, Université de Liège (B5), B-4000 Liège, BelgiumDQMP, University of Geneva, 24 Quai E.-Ansermet, CH-1211 Geneva, SwitzerlandRare earth vanadate perovskites exhibit a phase diagram in which two different types of structural distortions coexist: the strongest, the rotation of the oxygen octahedra, comes from the small tolerance factor of the perovskite cell (t = 0.88 for LaVO3) and the smaller one comes from inter-site d-orbital interactions manifesting as a cooperative Jahn-Teller effect. Epitaxial strain acts on octahedral rotations and crystal field symmetry to alter this complex lattice-orbit coupling. In this study, LaVO3 thin film structures have been investigated by X-ray diffraction and scanning transmission electron microscopy. The analysis shows two different orientations of octahedral tilt patterns, as well as two distinct temperature behaviors, for compressive and tensile film strain states. Ab initio calculations capture the strain effect on the tilt pattern orientation in agreement with experimental data.http://dx.doi.org/10.1063/1.5021844 |
| spellingShingle | H. Meley Karandeep L. Oberson J. de Bruijckere D. T. L. Alexander J.-M. Triscone Ph. Ghosez S. Gariglio Structural analysis of LaVO3 thin films under epitaxial strain APL Materials |
| title | Structural analysis of LaVO3 thin films under epitaxial strain |
| title_full | Structural analysis of LaVO3 thin films under epitaxial strain |
| title_fullStr | Structural analysis of LaVO3 thin films under epitaxial strain |
| title_full_unstemmed | Structural analysis of LaVO3 thin films under epitaxial strain |
| title_short | Structural analysis of LaVO3 thin films under epitaxial strain |
| title_sort | structural analysis of lavo3 thin films under epitaxial strain |
| url | http://dx.doi.org/10.1063/1.5021844 |
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