Multiple linear regression based illumination normalization for non-uniform light image thresholding
Thresholding-based two-class image binarization is one of the simplest and most popular approaches. However, the performance of global thresholding degrades under non-uniform lighting conditions. Local thresholding methods are widely used for binarizing uneven light images. The appropriate choice of...
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| Format: | Article |
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Elsevier
2024-03-01
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| Series: | e-Prime: Advances in Electrical Engineering, Electronics and Energy |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2772671123003066 |
| _version_ | 1797256261081759744 |
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| author | Tapaswini Pattnaik Priyadarshi Kanungo Tejaswini Kar Prabodh Kumar Sahoo |
| author_facet | Tapaswini Pattnaik Priyadarshi Kanungo Tejaswini Kar Prabodh Kumar Sahoo |
| author_sort | Tapaswini Pattnaik |
| collection | DOAJ |
| description | Thresholding-based two-class image binarization is one of the simplest and most popular approaches. However, the performance of global thresholding degrades under non-uniform lighting conditions. Local thresholding methods are widely used for binarizing uneven light images. The appropriate choice of the initial size of the window and designing the bimodal criteria function are the most challenging tasks for the local thresholding approaches. Therefore, to make it simpler, in this work, a novel approach is developed to improve the efficacy of binarizing any uneven light images. To begin with, a two stage approach is developed to extract valid training sample points from the uneven light images for estimating the illumination surface. In addition, the Multiple-Linear-Regression (MLR) method is applied on the extracted training sample points to estimate the illumination surface. Furthermore, the estimated illumination surface is used to normalize the non-uniform light of the image to binarize the image using Otsu’s global thresholding. The proposed approach is validated on different variants of uneven light images and with six different states of art uneven light image binarization approaches. It is observed from the simulations that the performance of the proposed approach outperforms the other approaches in qualitative as well as quantitative measures. Further, the binarization of uneven document image methods are not effective on object background binarization of uneven images. The proposed approach has the average F-Measure (F1) score of 0.98, average Jaccard Index (JI) score of 0.97, average Percentage of Misclassification Error (PME) score of 1.10 and the computational complexity of 2.64 sec. |
| first_indexed | 2024-03-08T17:05:43Z |
| format | Article |
| id | doaj.art-324f9e7cd6744a8ebfb914719ea2066b |
| institution | Directory Open Access Journal |
| issn | 2772-6711 |
| language | English |
| last_indexed | 2024-04-24T22:18:56Z |
| publishDate | 2024-03-01 |
| publisher | Elsevier |
| record_format | Article |
| series | e-Prime: Advances in Electrical Engineering, Electronics and Energy |
| spelling | doaj.art-324f9e7cd6744a8ebfb914719ea2066b2024-03-20T06:11:45ZengElseviere-Prime: Advances in Electrical Engineering, Electronics and Energy2772-67112024-03-017100411Multiple linear regression based illumination normalization for non-uniform light image thresholdingTapaswini Pattnaik0Priyadarshi Kanungo1Tejaswini Kar2Prabodh Kumar Sahoo3Electronics and Tele communication Engineering, Biju Patnaik University of Technology, Rourkela, 769015, Odisha, India; Electronics and Tele communication Engineering, C. V. Raman Global University, Janla, Bhubaneswar, 752054, Odisha, India; Corresponding author at: Electronics and Tele communication Engineering, C. V. Raman Global University, Janla, Bhubaneswar, 752054, Odisha, India.Electronics and Tele communication Engineering, C. V. Raman Global University, Janla, Bhubaneswar, 752054, Odisha, IndiaSchool of Electronics Engineering, KIIT deemed to be University, KIIT Rd, Patia, Bhubaneswar, 751024, Odisha, IndiaDepartment of Mechatronics Engineering, Parul Institute of Technology, Parul University, Vadodara, Gujarat, 391760, IndiaThresholding-based two-class image binarization is one of the simplest and most popular approaches. However, the performance of global thresholding degrades under non-uniform lighting conditions. Local thresholding methods are widely used for binarizing uneven light images. The appropriate choice of the initial size of the window and designing the bimodal criteria function are the most challenging tasks for the local thresholding approaches. Therefore, to make it simpler, in this work, a novel approach is developed to improve the efficacy of binarizing any uneven light images. To begin with, a two stage approach is developed to extract valid training sample points from the uneven light images for estimating the illumination surface. In addition, the Multiple-Linear-Regression (MLR) method is applied on the extracted training sample points to estimate the illumination surface. Furthermore, the estimated illumination surface is used to normalize the non-uniform light of the image to binarize the image using Otsu’s global thresholding. The proposed approach is validated on different variants of uneven light images and with six different states of art uneven light image binarization approaches. It is observed from the simulations that the performance of the proposed approach outperforms the other approaches in qualitative as well as quantitative measures. Further, the binarization of uneven document image methods are not effective on object background binarization of uneven images. The proposed approach has the average F-Measure (F1) score of 0.98, average Jaccard Index (JI) score of 0.97, average Percentage of Misclassification Error (PME) score of 1.10 and the computational complexity of 2.64 sec.http://www.sciencedirect.com/science/article/pii/S2772671123003066Dual thresholdingEdge detectionRegressionIllumination estimationIllumination normalizationImage thresholding |
| spellingShingle | Tapaswini Pattnaik Priyadarshi Kanungo Tejaswini Kar Prabodh Kumar Sahoo Multiple linear regression based illumination normalization for non-uniform light image thresholding e-Prime: Advances in Electrical Engineering, Electronics and Energy Dual thresholding Edge detection Regression Illumination estimation Illumination normalization Image thresholding |
| title | Multiple linear regression based illumination normalization for non-uniform light image thresholding |
| title_full | Multiple linear regression based illumination normalization for non-uniform light image thresholding |
| title_fullStr | Multiple linear regression based illumination normalization for non-uniform light image thresholding |
| title_full_unstemmed | Multiple linear regression based illumination normalization for non-uniform light image thresholding |
| title_short | Multiple linear regression based illumination normalization for non-uniform light image thresholding |
| title_sort | multiple linear regression based illumination normalization for non uniform light image thresholding |
| topic | Dual thresholding Edge detection Regression Illumination estimation Illumination normalization Image thresholding |
| url | http://www.sciencedirect.com/science/article/pii/S2772671123003066 |
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