Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films
For the research presented in this paper, hybrid organic-inorganic materials were prepared using a modified sol-gel reaction. Hybrid organic-inorganic compounds were synthesized in ethanol using methylmethacrylate (MMA), SiO2 nanoparticles, and 3-trimetoxi-silil-propilmethacrylate (TMSPM) as couplin...
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| Format: | Article |
| Language: | English |
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Galati University Press
2019-12-01
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| Series: | The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science |
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| Online Access: | https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/2817 |
| _version_ | 1818879013245943808 |
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| author | Elena Emanuela HERBEI |
| author_facet | Elena Emanuela HERBEI |
| author_sort | Elena Emanuela HERBEI |
| collection | DOAJ |
| description | For the research presented in this paper, hybrid organic-inorganic materials were prepared using a modified sol-gel reaction.
Hybrid organic-inorganic compounds were synthesized in ethanol using methylmethacrylate (MMA), SiO2 nanoparticles, and 3-trimetoxi-silil-propilmethacrylate (TMSPM) as coupling agent. For the deposition of thin films, the spincoating method was used.
The electrical measurements of dielectric thin films were done using a metalinsulator-metal (MIM) devices fabricated to study the dielectric constant of the films as function of frequency (measured at 1 MHz). Electrical results show a weak trend of the dielectric constant of the hybrid films with different MMA molar ratio. More importantly, the PMMA-SiO2 hybrid films showed a higher dielectric constant than SiO2 and PMMA layers, due to the presence of additional C-O-C bond. For the calculation of dielectric permittivity, the thickness of thin films was measured using cross-section SEM micrographs and the value of dielectric permittivity was calculated using electrical capacitance formula. |
| first_indexed | 2024-12-19T14:23:19Z |
| format | Article |
| id | doaj.art-3256255ddc644c6197438da82a5e74fd |
| institution | Directory Open Access Journal |
| issn | 2668-4748 2668-4756 |
| language | English |
| last_indexed | 2024-12-19T14:23:19Z |
| publishDate | 2019-12-01 |
| publisher | Galati University Press |
| record_format | Article |
| series | The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science |
| spelling | doaj.art-3256255ddc644c6197438da82a5e74fd2022-12-21T20:17:42ZengGalati University PressThe Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science2668-47482668-47562019-12-0142410.35219/mms.2019.4.07Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin FilmsElena Emanuela HERBEI0"Dunarea de Jos" University of Galati, RomaniaFor the research presented in this paper, hybrid organic-inorganic materials were prepared using a modified sol-gel reaction. Hybrid organic-inorganic compounds were synthesized in ethanol using methylmethacrylate (MMA), SiO2 nanoparticles, and 3-trimetoxi-silil-propilmethacrylate (TMSPM) as coupling agent. For the deposition of thin films, the spincoating method was used. The electrical measurements of dielectric thin films were done using a metalinsulator-metal (MIM) devices fabricated to study the dielectric constant of the films as function of frequency (measured at 1 MHz). Electrical results show a weak trend of the dielectric constant of the hybrid films with different MMA molar ratio. More importantly, the PMMA-SiO2 hybrid films showed a higher dielectric constant than SiO2 and PMMA layers, due to the presence of additional C-O-C bond. For the calculation of dielectric permittivity, the thickness of thin films was measured using cross-section SEM micrographs and the value of dielectric permittivity was calculated using electrical capacitance formula.https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/2817thin filmsdielectricPMMA-SiO2nanoparticles |
| spellingShingle | Elena Emanuela HERBEI Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science thin films dielectric PMMA-SiO2 nanoparticles |
| title | Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films |
| title_full | Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films |
| title_fullStr | Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films |
| title_full_unstemmed | Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films |
| title_short | Dielectric Characterization of SiO2-PMMA Organic – Inorganic Hybrid Thin Films |
| title_sort | dielectric characterization of sio2 pmma organic inorganic hybrid thin films |
| topic | thin films dielectric PMMA-SiO2 nanoparticles |
| url | https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/2817 |
| work_keys_str_mv | AT elenaemanuelaherbei dielectriccharacterizationofsio2pmmaorganicinorganichybridthinfilms |