Repulsive Force for Micro- and Nano-Non-Contact Manipulation
Non-contact positioning of micro-objects using electric fields has been widely explored, based on several physical principles such as electrophoresis, dielectrophoresis (DEP) or optical dielectrophoresis (ODEP), in which the actuation force is induced by an electric charge or an electric dipole plac...
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| Format: | Article |
| Language: | English |
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MDPI AG
2023-03-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/13/6/3886 |
| _version_ | 1797613616368713728 |
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| author | Amélie Cot Patrick Rougeot Sophie Lakard Michaël Gauthier Jérôme Dejeu |
| author_facet | Amélie Cot Patrick Rougeot Sophie Lakard Michaël Gauthier Jérôme Dejeu |
| author_sort | Amélie Cot |
| collection | DOAJ |
| description | Non-contact positioning of micro-objects using electric fields has been widely explored, based on several physical principles such as electrophoresis, dielectrophoresis (DEP) or optical dielectrophoresis (ODEP), in which the actuation force is induced by an electric charge or an electric dipole placed in an electric field. In this paper, we introduce a new way to control charges in non-contact positioning of micro-objects using chemical functionalization (3-aminopropyl) triethoxysilane—APTES) able to localize charges on a substrate and/or on a micro-object. We demonstrate that this functionalization in a liquid with a low ionic strength is able to concentrate a significant amount of electric charges on surfaces generating an electric field over a long distance (about 10 microns), also called a large exclusion zone (EZ). A model is proposed and validated with electrostatic force measurements between substrate and microparticles (diameter up to 40 µm). We demonstrate that the magnitude of the force and the force range decrease rapidly when the ionic strength of the medium increases. Based on the proposed model, we show that this new way to localize charges on micro-objects may be used for non-contact positioning. |
| first_indexed | 2024-03-11T06:57:17Z |
| format | Article |
| id | doaj.art-33cc118a13ae4f7abcb21ab4a3644a64 |
| institution | Directory Open Access Journal |
| issn | 2076-3417 |
| language | English |
| last_indexed | 2024-03-11T06:57:17Z |
| publishDate | 2023-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj.art-33cc118a13ae4f7abcb21ab4a3644a642023-11-17T09:28:21ZengMDPI AGApplied Sciences2076-34172023-03-01136388610.3390/app13063886Repulsive Force for Micro- and Nano-Non-Contact ManipulationAmélie Cot0Patrick Rougeot1Sophie Lakard2Michaël Gauthier3Jérôme Dejeu4FEMTO-ST Institute, SUPMICROTECH, CNRS, Université Bourgogne Franche-Comté, 25000 Besançon, FranceFEMTO-ST Institute, SUPMICROTECH, CNRS, Université Bourgogne Franche-Comté, 25000 Besançon, FranceUTINAM Institute, Université Franche-Comté, 16 Route de Gray, 25030 Besançon, FranceFEMTO-ST Institute, SUPMICROTECH, CNRS, Université Bourgogne Franche-Comté, 25000 Besançon, FranceFEMTO-ST Institute, SUPMICROTECH, CNRS, Université Bourgogne Franche-Comté, 25000 Besançon, FranceNon-contact positioning of micro-objects using electric fields has been widely explored, based on several physical principles such as electrophoresis, dielectrophoresis (DEP) or optical dielectrophoresis (ODEP), in which the actuation force is induced by an electric charge or an electric dipole placed in an electric field. In this paper, we introduce a new way to control charges in non-contact positioning of micro-objects using chemical functionalization (3-aminopropyl) triethoxysilane—APTES) able to localize charges on a substrate and/or on a micro-object. We demonstrate that this functionalization in a liquid with a low ionic strength is able to concentrate a significant amount of electric charges on surfaces generating an electric field over a long distance (about 10 microns), also called a large exclusion zone (EZ). A model is proposed and validated with electrostatic force measurements between substrate and microparticles (diameter up to 40 µm). We demonstrate that the magnitude of the force and the force range decrease rapidly when the ionic strength of the medium increases. Based on the proposed model, we show that this new way to localize charges on micro-objects may be used for non-contact positioning.https://www.mdpi.com/2076-3417/13/6/3886APTES graftingexclusion zone (EZ)force modelingnon-contact-manipulationPANI electropolymerizationrepulsive force |
| spellingShingle | Amélie Cot Patrick Rougeot Sophie Lakard Michaël Gauthier Jérôme Dejeu Repulsive Force for Micro- and Nano-Non-Contact Manipulation Applied Sciences APTES grafting exclusion zone (EZ) force modeling non-contact-manipulation PANI electropolymerization repulsive force |
| title | Repulsive Force for Micro- and Nano-Non-Contact Manipulation |
| title_full | Repulsive Force for Micro- and Nano-Non-Contact Manipulation |
| title_fullStr | Repulsive Force for Micro- and Nano-Non-Contact Manipulation |
| title_full_unstemmed | Repulsive Force for Micro- and Nano-Non-Contact Manipulation |
| title_short | Repulsive Force for Micro- and Nano-Non-Contact Manipulation |
| title_sort | repulsive force for micro and nano non contact manipulation |
| topic | APTES grafting exclusion zone (EZ) force modeling non-contact-manipulation PANI electropolymerization repulsive force |
| url | https://www.mdpi.com/2076-3417/13/6/3886 |
| work_keys_str_mv | AT ameliecot repulsiveforceformicroandnanononcontactmanipulation AT patrickrougeot repulsiveforceformicroandnanononcontactmanipulation AT sophielakard repulsiveforceformicroandnanononcontactmanipulation AT michaelgauthier repulsiveforceformicroandnanononcontactmanipulation AT jeromedejeu repulsiveforceformicroandnanononcontactmanipulation |