Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and...

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Main Authors: Marius van den Berg, Ardeshir Moeinian, Arne Kobald, Yu-Ting Chen, Anke Horneber, Steffen Strehle, Alfred J. Meixner, Dai Zhang
Format: Article
Language:English
Published: Beilstein-Institut 2020-07-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.11.99
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author Marius van den Berg
Ardeshir Moeinian
Arne Kobald
Yu-Ting Chen
Anke Horneber
Steffen Strehle
Alfred J. Meixner
Dai Zhang
author_facet Marius van den Berg
Ardeshir Moeinian
Arne Kobald
Yu-Ting Chen
Anke Horneber
Steffen Strehle
Alfred J. Meixner
Dai Zhang
author_sort Marius van den Berg
collection DOAJ
description Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip–sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.
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spelling doaj.art-346f396077b34932802afee5aeac07752022-12-21T23:39:40ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862020-07-011111147115610.3762/bjnano.11.992190-4286-11-99Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopyMarius van den Berg0Ardeshir Moeinian1Arne Kobald2Yu-Ting Chen3Anke Horneber4Steffen Strehle5Alfred J. Meixner6Dai Zhang7Institute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Electronic Devices and Circuits, Ulm University, Albert-Einstein-Allee 45, Ulm, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Micro- and Nanotechnology, Technische Universität Ilmenau, Max-Planck-Ring 12, Ilmenau, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyTip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip–sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.https://doi.org/10.3762/bjnano.11.99core–shell nanowireslocal crystallinitypolarization angle-resolved spectroscopysilicontip-enhanced raman spectroscopy
spellingShingle Marius van den Berg
Ardeshir Moeinian
Arne Kobald
Yu-Ting Chen
Anke Horneber
Steffen Strehle
Alfred J. Meixner
Dai Zhang
Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
Beilstein Journal of Nanotechnology
core–shell nanowires
local crystallinity
polarization angle-resolved spectroscopy
silicon
tip-enhanced raman spectroscopy
title Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
title_full Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
title_fullStr Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
title_full_unstemmed Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
title_short Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
title_sort revealing the local crystallinity of single silicon core shell nanowires using tip enhanced raman spectroscopy
topic core–shell nanowires
local crystallinity
polarization angle-resolved spectroscopy
silicon
tip-enhanced raman spectroscopy
url https://doi.org/10.3762/bjnano.11.99
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