Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and...
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Format: | Article |
Language: | English |
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Beilstein-Institut
2020-07-01
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Series: | Beilstein Journal of Nanotechnology |
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Online Access: | https://doi.org/10.3762/bjnano.11.99 |
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author | Marius van den Berg Ardeshir Moeinian Arne Kobald Yu-Ting Chen Anke Horneber Steffen Strehle Alfred J. Meixner Dai Zhang |
author_facet | Marius van den Berg Ardeshir Moeinian Arne Kobald Yu-Ting Chen Anke Horneber Steffen Strehle Alfred J. Meixner Dai Zhang |
author_sort | Marius van den Berg |
collection | DOAJ |
description | Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip–sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques. |
first_indexed | 2024-12-13T15:46:57Z |
format | Article |
id | doaj.art-346f396077b34932802afee5aeac0775 |
institution | Directory Open Access Journal |
issn | 2190-4286 |
language | English |
last_indexed | 2024-12-13T15:46:57Z |
publishDate | 2020-07-01 |
publisher | Beilstein-Institut |
record_format | Article |
series | Beilstein Journal of Nanotechnology |
spelling | doaj.art-346f396077b34932802afee5aeac07752022-12-21T23:39:40ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862020-07-011111147115610.3762/bjnano.11.992190-4286-11-99Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopyMarius van den Berg0Ardeshir Moeinian1Arne Kobald2Yu-Ting Chen3Anke Horneber4Steffen Strehle5Alfred J. Meixner6Dai Zhang7Institute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Electronic Devices and Circuits, Ulm University, Albert-Einstein-Allee 45, Ulm, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Micro- and Nanotechnology, Technische Universität Ilmenau, Max-Planck-Ring 12, Ilmenau, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyInstitute of Physical and Theoretical Chemistry, Eberhard Karls University of Tübingen, Auf der Morgenstelle 15, Tübingen, GermanyTip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip–sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.https://doi.org/10.3762/bjnano.11.99core–shell nanowireslocal crystallinitypolarization angle-resolved spectroscopysilicontip-enhanced raman spectroscopy |
spellingShingle | Marius van den Berg Ardeshir Moeinian Arne Kobald Yu-Ting Chen Anke Horneber Steffen Strehle Alfred J. Meixner Dai Zhang Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy Beilstein Journal of Nanotechnology core–shell nanowires local crystallinity polarization angle-resolved spectroscopy silicon tip-enhanced raman spectroscopy |
title | Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy |
title_full | Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy |
title_fullStr | Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy |
title_full_unstemmed | Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy |
title_short | Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy |
title_sort | revealing the local crystallinity of single silicon core shell nanowires using tip enhanced raman spectroscopy |
topic | core–shell nanowires local crystallinity polarization angle-resolved spectroscopy silicon tip-enhanced raman spectroscopy |
url | https://doi.org/10.3762/bjnano.11.99 |
work_keys_str_mv | AT mariusvandenberg revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT ardeshirmoeinian revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT arnekobald revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT yutingchen revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT ankehorneber revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT steffenstrehle revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT alfredjmeixner revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy AT daizhang revealingthelocalcrystallinityofsinglesiliconcoreshellnanowiresusingtipenhancedramanspectroscopy |