Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor–liquid–solid growth and...

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Bibliographic Details
Main Authors:	Marius van den Berg, Ardeshir Moeinian, Arne Kobald, Yu-Ting Chen, Anke Horneber, Steffen Strehle, Alfred J. Meixner, Dai Zhang
Format:	Article
Language:	English
Published:	Beilstein-Institut 2020-07-01
Series:	Beilstein Journal of Nanotechnology
Subjects:	core–shell nanowires local crystallinity polarization angle-resolved spectroscopy silicon tip-enhanced raman spectroscopy
Online Access:	https://doi.org/10.3762/bjnano.11.99

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