The small slope approximation method applied to a two dimensional dielectric-topological insulator material rough interface
In this paper, the first order perturbation theory (PT) and the small slope approximation (SSA) are employed to analyze the scattering behavior of a two dimensional dielectric-topological insulator (TI) rough interface with Gaussian distribution. Zeroth and first order scattering amplitudes are util...
Main Authors: | Muhammad Sajid Hanif, Muhammad Arshad Fiaz, Ayman A. Althuwayb |
---|---|
Format: | Article |
Language: | English |
Published: |
Elsevier
2023-03-01
|
Series: | Alexandria Engineering Journal |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S1110016822008237 |
Similar Items
-
Electronic properties of topological rough nanowires for thermoelectrical performance
by: J. Estrada, et al.
Published: (2022-12-01) -
Rough representations of rough topological groups
by: Essoyomewè Kieou, et al.
Published: (2023-10-01) -
Photonic topological Anderson insulator in a two-dimensional atomic lattice
by: Skipetrov, Sergey E., et al.
Published: (2023-04-01) -
Tiling Photonic Topological Insulator for Laser Applications
by: Petr N. Kim, et al.
Published: (2023-03-01) -
Orbital dynamics in 2D topological and Chern insulators
by: Daniel Faílde, et al.
Published: (2021-01-01)