Unusual local electric field concentration in multilayer ceramic capacitors
Local electric-field around multitype pores (dielectric pore, interface pore, electrode pore) in multilayer ceramic capacitors (MLCCs) was investigated using Kelvin probe force microscopy combined with the finite element simulation to understand the effect of pores on the electric reliability of MLC...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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Elsevier
2023-03-01
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| Series: | Journal of Materiomics |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352847822001277 |
| _version_ | 1797703232763461632 |
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| author | Wentong Du Huarong Zeng Weiwei Yang Kunyu Zhao Faqiang Zhang Guorong Li Yongxiang Li Zhifu Liu |
| author_facet | Wentong Du Huarong Zeng Weiwei Yang Kunyu Zhao Faqiang Zhang Guorong Li Yongxiang Li Zhifu Liu |
| author_sort | Wentong Du |
| collection | DOAJ |
| description | Local electric-field around multitype pores (dielectric pore, interface pore, electrode pore) in multilayer ceramic capacitors (MLCCs) was investigated using Kelvin probe force microscopy combined with the finite element simulation to understand the effect of pores on the electric reliability of MLCCs. Electric-field is found to be concentrated significantly in the vicinity of these pores and the strength of the local electric-field is 1.5–5.0 times of the nominal strength. Unexpectedly, the concentration degree of the pores in the inner electrode is much higher than that in the dielectrics and dielectric-electrode interfaces. Meanwhile, geometry orientations are found to have a remarkable influence on the local electric field strength. The pores act as an insulation degradation precursor via local electric, thermal center, and oxygen vacancies accumulation center. Such unusual local electric field concentration of multitype pores can provide new insights into the understanding of insulation degradation evolution, processing tailoring and design optimization for MLCCs. |
| first_indexed | 2024-03-12T05:01:36Z |
| format | Article |
| id | doaj.art-36793f8ef9dd42bf9d873b3baaaa8d9b |
| institution | Directory Open Access Journal |
| issn | 2352-8478 |
| language | English |
| last_indexed | 2024-03-12T05:01:36Z |
| publishDate | 2023-03-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Journal of Materiomics |
| spelling | doaj.art-36793f8ef9dd42bf9d873b3baaaa8d9b2023-09-03T09:09:50ZengElsevierJournal of Materiomics2352-84782023-03-0192403409Unusual local electric field concentration in multilayer ceramic capacitorsWentong Du0Huarong Zeng1Weiwei Yang2Kunyu Zhao3Faqiang Zhang4Guorong Li5Yongxiang Li6Zhifu Liu7CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, ChinaCAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China; Corresponding author. CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China.CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, ChinaCAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China; Corresponding author. CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China.CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, ChinaCAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, ChinaSchool of Engineering, RMIT University, Melbourne, VIC, 3000, AustraliaCAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China; Corresponding author. CAS Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201899, China.Local electric-field around multitype pores (dielectric pore, interface pore, electrode pore) in multilayer ceramic capacitors (MLCCs) was investigated using Kelvin probe force microscopy combined with the finite element simulation to understand the effect of pores on the electric reliability of MLCCs. Electric-field is found to be concentrated significantly in the vicinity of these pores and the strength of the local electric-field is 1.5–5.0 times of the nominal strength. Unexpectedly, the concentration degree of the pores in the inner electrode is much higher than that in the dielectrics and dielectric-electrode interfaces. Meanwhile, geometry orientations are found to have a remarkable influence on the local electric field strength. The pores act as an insulation degradation precursor via local electric, thermal center, and oxygen vacancies accumulation center. Such unusual local electric field concentration of multitype pores can provide new insights into the understanding of insulation degradation evolution, processing tailoring and design optimization for MLCCs.http://www.sciencedirect.com/science/article/pii/S2352847822001277Multilayer ceramic capacitors (MLCCs)Kelvin probe force microscopyPoreLocal electric field concentration |
| spellingShingle | Wentong Du Huarong Zeng Weiwei Yang Kunyu Zhao Faqiang Zhang Guorong Li Yongxiang Li Zhifu Liu Unusual local electric field concentration in multilayer ceramic capacitors Journal of Materiomics Multilayer ceramic capacitors (MLCCs) Kelvin probe force microscopy Pore Local electric field concentration |
| title | Unusual local electric field concentration in multilayer ceramic capacitors |
| title_full | Unusual local electric field concentration in multilayer ceramic capacitors |
| title_fullStr | Unusual local electric field concentration in multilayer ceramic capacitors |
| title_full_unstemmed | Unusual local electric field concentration in multilayer ceramic capacitors |
| title_short | Unusual local electric field concentration in multilayer ceramic capacitors |
| title_sort | unusual local electric field concentration in multilayer ceramic capacitors |
| topic | Multilayer ceramic capacitors (MLCCs) Kelvin probe force microscopy Pore Local electric field concentration |
| url | http://www.sciencedirect.com/science/article/pii/S2352847822001277 |
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