Industrial Product Surface Anomaly Detection with Realistic Synthetic Anomalies Based on Defect Map Prediction

Industrial Product Surface Anomaly Detection with Realistic Synthetic Anomalies Based on Defect Map Prediction

The occurrence of anomalies on the surface of industrial products can lead to issues such as decreased product quality, reduced production efficiency, and safety hazards. Early detection and resolution of these problems are crucial for ensuring the quality and efficiency of production. The key chall...

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Bibliografische gegevens
Hoofdauteurs: Tao Peng, Yu Zheng, Lin Zhao, Enrang Zheng
Formaat: Artikel
Taal:English
Gepubliceerd in: MDPI AG 2024-01-01
Reeks:Sensors
Onderwerpen:
defect detection
image reconstruction
synthetic anomalies
defect separation
Online toegang:https://www.mdpi.com/1424-8220/24/1/264

Internet

https://www.mdpi.com/1424-8220/24/1/264

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