Detection of limited-energy α particles using CR-39 in laser-induced p −11B reaction

Due to the harsh radiation environment produced by strong laser plasma, most of the detectors based on semiconductors cannot perform well. So, it is important to develop new detecting techniques with higher detection thresholds and highly charged particle resolution for investigating nuclear fusion...

Full description

Bibliographic Details
Main Authors: Putong Wang, Xiangai Deng, Zhiguo Ma, Changbo Fu, Lulin Fan, Qingsong Wang, Jiancai Xu, Tongjun Xu, Liangliang Ji, Baifei Shen, Yancheng Liu, Xiguang Cao, Guoqiang Zhang, Yugang Ma
Format: Article
Language:English
Published: Frontiers Media S.A. 2023-04-01
Series:Frontiers in Physics
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fphy.2023.1166347/full
Description
Summary:Due to the harsh radiation environment produced by strong laser plasma, most of the detectors based on semiconductors cannot perform well. So, it is important to develop new detecting techniques with higher detection thresholds and highly charged particle resolution for investigating nuclear fusion reactions in laser-plasma environments. The Columbia Resin No. 39 (CR-39) detector is mainly sensitive to ions and insensitive to the backgrounds, such as electrons and photons. The detector has been widely used to detect charged particles in laser-plasma environments. In this work, we used a potassium–ethanol–water (PEW) etching solution to reduce the proton sensitivity of CR-39, by raising the detection threshold for the research of laser-induced 11B(p, α)2α reaction. We calibrated the 3–5 MeV α particles in an etching condition of 60°C PEW-25 solution (17% KOH + 25%C2H5OH + 58%H2O) and compared them with the manufacturer’s recommended etching conditions of 6.25 N NaOH aqueous solution at 98°C in our laser-induced nuclear reaction experiment. The results indicate, with the PEW-25 solution, that CR-39 is more suitable to distinguish α tracks from the proton background in our experiment. We also present a method to estimate the minimum detection range of α energy on specific etching conditions in our experiment.
ISSN:2296-424X