Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films
Copper-doped hematite thin films were prepared by spray pyrolysis technique using a mixture of ethanol and distilled water precursors. Visual observations showed that aqua precursor produced films of less integrity compared with ethanol that produced thin, uniform and transparent yellowish-brown fi...
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Nigerian Society of Physical Sciences
2023-06-01
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| Series: | Journal of Nigerian Society of Physical Sciences |
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| Online Access: | https://journal.nsps.org.ng/index.php/jnsps/article/view/1180 |
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| author | Adeniyi Yisau Fasasi Emmanuel Ajenifuja Edward Osagie Lukman Animashaun Abiodun Adeoye Eusebius Obiajunwa |
| author_facet | Adeniyi Yisau Fasasi Emmanuel Ajenifuja Edward Osagie Lukman Animashaun Abiodun Adeoye Eusebius Obiajunwa |
| author_sort | Adeniyi Yisau Fasasi |
| collection | DOAJ |
| description |
Copper-doped hematite thin films were prepared by spray pyrolysis technique using a mixture of ethanol and distilled water precursors. Visual observations showed that aqua precursor produced films of less integrity compared with ethanol that produced thin, uniform and transparent yellowish-brown films that adhered well to the substrate. Composition and thickness measurements determined by RBS revealed that ethanol precursor produced thinner films of 94.45 and 51.77 nm while aqua precursor produced films of 1,370 and 1,120 nm for undoped and Cu-doped Fe2O3 respectively. This is an indication that ethanol solutions produced nano-thick films of high integrity. The composition revealed that only the Cu-doped Fe2O3 deposited by ethanol solution gave composition close to stoichiometric Fe2O3 while the others gave non-stoichiometric Fe(OH)3 . Optical characterization carried out using UV-visible spectrophotometer in transmittance mode indicated that the film thickness was directly proportional to the number of passes which is inversely proportional to the transmittance. Three bandgap determination methods namely; Tauc, Absorption Fitting Spectrum (AFS) and Davis-Mott were employed with the result that Tauc and AFS gave close direct and indirect bandgap energies (Eg) of 3.44 and 1.98 for AFS and 3.43 and 2.32 eV for Tauc respectively. The Urbach tail energy determined was 1,100 meV which is an indication of a broad onset of absorption. The steepness parameter (?) was found to be 7.83 while the electron-phonon (Eph ) coupling energy was found to be 0.85 eV. It was also observed that the refractive index (n) was about 15 times greater than the extinction coefficient (k). In the study of the dispersion parameters using single oscillator and Sellmier models, the values of the single oscillator energy (Eosc ), dispersion energy (Ed), zero frequency dielectric constant, zero frequency refractive index, the average oscillator strength (So), the average oscillator parameter and the dispersion parameters were determined. All the values of the parameters estimated are of the same order of magnitude with other semiconducting materials. The study showed that Cu-doped Fe2O3 could be employed as dielectric material as well as in optoelectronic devices.
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| first_indexed | 2024-03-13T05:25:07Z |
| format | Article |
| id | doaj.art-389184e559de4db29d4aa72bbfa2ab1c |
| institution | Directory Open Access Journal |
| issn | 2714-2817 2714-4704 |
| language | English |
| last_indexed | 2024-03-13T05:25:07Z |
| publishDate | 2023-06-01 |
| publisher | Nigerian Society of Physical Sciences |
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| series | Journal of Nigerian Society of Physical Sciences |
| spelling | doaj.art-389184e559de4db29d4aa72bbfa2ab1c2023-06-15T06:47:27ZengNigerian Society of Physical SciencesJournal of Nigerian Society of Physical Sciences2714-28172714-47042023-06-015310.46481/jnsps.2023.1180Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin FilmsAdeniyi Yisau Fasasi0Emmanuel Ajenifuja1Edward Osagie2Lukman Animashaun3Abiodun Adeoye4Eusebius Obiajunwa5Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, NigeriaCenter for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria.Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, NigeriaDepartment of Physics, Electronics & Earth Sciences, Fountain University, Osogbo, NigeriaTechnical University, Km 15, Lagos Ibadan Expressway, Ibadan, Oyo State, Nigeria.Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife, Nigeria Copper-doped hematite thin films were prepared by spray pyrolysis technique using a mixture of ethanol and distilled water precursors. Visual observations showed that aqua precursor produced films of less integrity compared with ethanol that produced thin, uniform and transparent yellowish-brown films that adhered well to the substrate. Composition and thickness measurements determined by RBS revealed that ethanol precursor produced thinner films of 94.45 and 51.77 nm while aqua precursor produced films of 1,370 and 1,120 nm for undoped and Cu-doped Fe2O3 respectively. This is an indication that ethanol solutions produced nano-thick films of high integrity. The composition revealed that only the Cu-doped Fe2O3 deposited by ethanol solution gave composition close to stoichiometric Fe2O3 while the others gave non-stoichiometric Fe(OH)3 . Optical characterization carried out using UV-visible spectrophotometer in transmittance mode indicated that the film thickness was directly proportional to the number of passes which is inversely proportional to the transmittance. Three bandgap determination methods namely; Tauc, Absorption Fitting Spectrum (AFS) and Davis-Mott were employed with the result that Tauc and AFS gave close direct and indirect bandgap energies (Eg) of 3.44 and 1.98 for AFS and 3.43 and 2.32 eV for Tauc respectively. The Urbach tail energy determined was 1,100 meV which is an indication of a broad onset of absorption. The steepness parameter (?) was found to be 7.83 while the electron-phonon (Eph ) coupling energy was found to be 0.85 eV. It was also observed that the refractive index (n) was about 15 times greater than the extinction coefficient (k). In the study of the dispersion parameters using single oscillator and Sellmier models, the values of the single oscillator energy (Eosc ), dispersion energy (Ed), zero frequency dielectric constant, zero frequency refractive index, the average oscillator strength (So), the average oscillator parameter and the dispersion parameters were determined. All the values of the parameters estimated are of the same order of magnitude with other semiconducting materials. The study showed that Cu-doped Fe2O3 could be employed as dielectric material as well as in optoelectronic devices. https://journal.nsps.org.ng/index.php/jnsps/article/view/1180thin filmbandgapUrbach Energyrefractive indexdispersion parametersOscillator parameters |
| spellingShingle | Adeniyi Yisau Fasasi Emmanuel Ajenifuja Edward Osagie Lukman Animashaun Abiodun Adeoye Eusebius Obiajunwa Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films Journal of Nigerian Society of Physical Sciences thin film bandgap Urbach Energy refractive index dispersion parameters Oscillator parameters |
| title | Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films |
| title_full | Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films |
| title_fullStr | Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films |
| title_full_unstemmed | Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films |
| title_short | Optical, Dielectric and Optoelectronic Properties of Spray Deposited Cu-doped Fe2O3 Thin Films |
| title_sort | optical dielectric and optoelectronic properties of spray deposited cu doped fe2o3 thin films |
| topic | thin film bandgap Urbach Energy refractive index dispersion parameters Oscillator parameters |
| url | https://journal.nsps.org.ng/index.php/jnsps/article/view/1180 |
| work_keys_str_mv | AT adeniyiyisaufasasi opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms AT emmanuelajenifuja opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms AT edwardosagie opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms AT lukmananimashaun opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms AT abiodunadeoye opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms AT eusebiusobiajunwa opticaldielectricandoptoelectronicpropertiesofspraydepositedcudopedfe2o3thinfilms |