Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface
In our paper we present the results of our research, which was carried out by means of semiconductor sensor techniques (SCS), which allowed evaluating heterogeneous death-rate of ozone (γ) Teflon surface. When ozone concentration is near to Ambient Air Standard value, γ is assessed to be equal...
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Format: | Article |
Language: | English |
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MDPI AG
2003-12-01
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Series: | Sensors |
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Online Access: | http://www.mdpi.com/1424-8220/3/11/504/ |
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author | Nataliya V. Finogenova Marina V. Strobkova Alexander K. Avetisov Serge A. Kazakov Fatima Kh. Chibirova Ludmila A. Obvintseva |
author_facet | Nataliya V. Finogenova Marina V. Strobkova Alexander K. Avetisov Serge A. Kazakov Fatima Kh. Chibirova Ludmila A. Obvintseva |
author_sort | Nataliya V. Finogenova |
collection | DOAJ |
description | In our paper we present the results of our research, which was carried out by means of semiconductor sensor techniques (SCS), which allowed evaluating heterogeneous death-rate of ozone (γ) Teflon surface. When ozone concentration is near to Ambient Air Standard value, γ is assessed to be equal to 6,57*10-7. High technique response provide possibility to determine ozone contents in the air media and the percentage of ozone, decomposed on the communication surfaces and on the surfaces of installation in the low concentration range (1–100 ppb). |
first_indexed | 2024-04-13T01:05:21Z |
format | Article |
id | doaj.art-38a956b026b941c4ae6902328d9d457d |
institution | Directory Open Access Journal |
issn | 1424-8220 |
language | English |
last_indexed | 2024-04-13T01:05:21Z |
publishDate | 2003-12-01 |
publisher | MDPI AG |
record_format | Article |
series | Sensors |
spelling | doaj.art-38a956b026b941c4ae6902328d9d457d2022-12-22T03:09:22ZengMDPI AGSensors1424-82202003-12-0131150450810.3390/s3110504Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon SurfaceNataliya V. FinogenovaMarina V. StrobkovaAlexander K. AvetisovSerge A. KazakovFatima Kh. ChibirovaLudmila A. ObvintsevaIn our paper we present the results of our research, which was carried out by means of semiconductor sensor techniques (SCS), which allowed evaluating heterogeneous death-rate of ozone (γ) Teflon surface. When ozone concentration is near to Ambient Air Standard value, γ is assessed to be equal to 6,57*10-7. High technique response provide possibility to determine ozone contents in the air media and the percentage of ozone, decomposed on the communication surfaces and on the surfaces of installation in the low concentration range (1–100 ppb).http://www.mdpi.com/1424-8220/3/11/504/semiconductor sensorsheterogeneous death-rate of ozoneTeflon |
spellingShingle | Nataliya V. Finogenova Marina V. Strobkova Alexander K. Avetisov Serge A. Kazakov Fatima Kh. Chibirova Ludmila A. Obvintseva Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface Sensors semiconductor sensors heterogeneous death-rate of ozone Teflon |
title | Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface |
title_full | Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface |
title_fullStr | Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface |
title_full_unstemmed | Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface |
title_short | Semiconductor Sensors Application for Definition of Factor of Ozone Heterogeneous Destruction on Teflon Surface |
title_sort | semiconductor sensors application for definition of factor of ozone heterogeneous destruction on teflon surface |
topic | semiconductor sensors heterogeneous death-rate of ozone Teflon |
url | http://www.mdpi.com/1424-8220/3/11/504/ |
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