Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments
This paper designs and makes an intelligent circuit characteristic tester. It is used to measure the characteristics of a specific amplifier circuit, and then to intelligently determine the reasons for the failure or change of the amplifier due to the change of components.The intelligent circuit cha...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9126824/ |
| _version_ | 1818920836896129024 |
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| author | Xiaonan Zhao Shuai Deng Yang Li |
| author_facet | Xiaonan Zhao Shuai Deng Yang Li |
| author_sort | Xiaonan Zhao |
| collection | DOAJ |
| description | This paper designs and makes an intelligent circuit characteristic tester. It is used to measure the characteristics of a specific amplifier circuit, and then to intelligently determine the reasons for the failure or change of the amplifier due to the change of components.The intelligent circuit characteristic tester is driven by a single chip microcomputer (MSP32F103V) to produce a 1 kHz sinusoidal excitation signal. The influence of the output module resistance is eliminated by an impedance matching circuit, and the input is measured. The input resistance, output resistance and magnification of the measured circuit are calculated by designing the peripheral resistance at both ends of the tested circuit. The output signal of the measured circuit is filtered for DC noise and then input to the single chip microcomputer by the AD637 DC conversion module. The amplifier's input and output resistance, magnification and fault analysis results are automatically processed and measured by the E76 module.For the result of circuit test, the tester can automatically and accurately judge and display the reason of circuit change within 2 seconds. |
| first_indexed | 2024-12-20T01:28:05Z |
| format | Article |
| id | doaj.art-38c14da304ff40de9644362c6dc3eef9 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-20T01:28:05Z |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-38c14da304ff40de9644362c6dc3eef92022-12-21T19:58:11ZengIEEEIEEE Access2169-35362020-01-01811951111951510.1109/ACCESS.2020.30051759126824Design of Intelligent Circuit Characteristic Tester for Use in Harsh EnvironmentsXiaonan Zhao0https://orcid.org/0000-0001-6075-4590Shuai Deng1Yang Li2Tianjin Key Laboratory of Wireless Mobile Communications and Power Transmission, Tianjin Normal University, Tianjin, ChinaCollege of Electronic and Communication Engineering, Tianjin Normal University, Tianjin, ChinaTianjin Key Laboratory of Wireless Mobile Communications and Power Transmission, Tianjin Normal University, Tianjin, ChinaThis paper designs and makes an intelligent circuit characteristic tester. It is used to measure the characteristics of a specific amplifier circuit, and then to intelligently determine the reasons for the failure or change of the amplifier due to the change of components.The intelligent circuit characteristic tester is driven by a single chip microcomputer (MSP32F103V) to produce a 1 kHz sinusoidal excitation signal. The influence of the output module resistance is eliminated by an impedance matching circuit, and the input is measured. The input resistance, output resistance and magnification of the measured circuit are calculated by designing the peripheral resistance at both ends of the tested circuit. The output signal of the measured circuit is filtered for DC noise and then input to the single chip microcomputer by the AD637 DC conversion module. The amplifier's input and output resistance, magnification and fault analysis results are automatically processed and measured by the E76 module.For the result of circuit test, the tester can automatically and accurately judge and display the reason of circuit change within 2 seconds.https://ieeexplore.ieee.org/document/9126824/Integrated circuitsautomatic testingmicrocomputers |
| spellingShingle | Xiaonan Zhao Shuai Deng Yang Li Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments IEEE Access Integrated circuits automatic testing microcomputers |
| title | Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments |
| title_full | Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments |
| title_fullStr | Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments |
| title_full_unstemmed | Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments |
| title_short | Design of Intelligent Circuit Characteristic Tester for Use in Harsh Environments |
| title_sort | design of intelligent circuit characteristic tester for use in harsh environments |
| topic | Integrated circuits automatic testing microcomputers |
| url | https://ieeexplore.ieee.org/document/9126824/ |
| work_keys_str_mv | AT xiaonanzhao designofintelligentcircuitcharacteristictesterforuseinharshenvironments AT shuaideng designofintelligentcircuitcharacteristictesterforuseinharshenvironments AT yangli designofintelligentcircuitcharacteristictesterforuseinharshenvironments |