Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser
Since its first application toward displacement measurements in the early-1960s, laser feedback interferometry has become a fast-developing precision measurement modality with many kinds of lasers. By employing the frequency-shifted optical feedback, microchip laser feedback interferometry has been...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2018-12-01
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| Series: | Applied Sciences |
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| Online Access: | http://www.mdpi.com/2076-3417/9/1/109 |
| _version_ | 1818848799471173632 |
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| author | Kaiyi Zhu Hongfang Chen Shulian Zhang Zhaoyao Shi Yun Wang Yidong Tan |
| author_facet | Kaiyi Zhu Hongfang Chen Shulian Zhang Zhaoyao Shi Yun Wang Yidong Tan |
| author_sort | Kaiyi Zhu |
| collection | DOAJ |
| description | Since its first application toward displacement measurements in the early-1960s, laser feedback interferometry has become a fast-developing precision measurement modality with many kinds of lasers. By employing the frequency-shifted optical feedback, microchip laser feedback interferometry has been widely researched due to its advantages of high sensitivity, simple structure, and easy alignment. More recently, the laser confocal feedback tomography has been proposed, which combines the high sensitivity of laser frequency-shifted feedback effect and the axial positioning ability of confocal microscopy. In this paper, the principles of a laser frequency-shifted optical feedback interferometer and laser confocal feedback tomography are briefly introduced. Then we describe their applications in various kinds of metrology regarding displacement measurement, vibration measurement, physical quantities measurement, imaging, profilometry, microstructure measurement, and so on. Finally, the existing challenges and promising future directions are discussed. |
| first_indexed | 2024-12-19T06:23:05Z |
| format | Article |
| id | doaj.art-393b0798468c4b2887439ad177a731b3 |
| institution | Directory Open Access Journal |
| issn | 2076-3417 |
| language | English |
| last_indexed | 2024-12-19T06:23:05Z |
| publishDate | 2018-12-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj.art-393b0798468c4b2887439ad177a731b32022-12-21T20:32:37ZengMDPI AGApplied Sciences2076-34172018-12-019110910.3390/app9010109app9010109Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip LaserKaiyi Zhu0Hongfang Chen1Shulian Zhang2Zhaoyao Shi3Yun Wang4Yidong Tan5The State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, ChinaCollege of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, ChinaThe State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, ChinaCollege of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, ChinaBeijing Institute of Space Electromechanical, Beijing 100076, ChinaThe State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, ChinaSince its first application toward displacement measurements in the early-1960s, laser feedback interferometry has become a fast-developing precision measurement modality with many kinds of lasers. By employing the frequency-shifted optical feedback, microchip laser feedback interferometry has been widely researched due to its advantages of high sensitivity, simple structure, and easy alignment. More recently, the laser confocal feedback tomography has been proposed, which combines the high sensitivity of laser frequency-shifted feedback effect and the axial positioning ability of confocal microscopy. In this paper, the principles of a laser frequency-shifted optical feedback interferometer and laser confocal feedback tomography are briefly introduced. Then we describe their applications in various kinds of metrology regarding displacement measurement, vibration measurement, physical quantities measurement, imaging, profilometry, microstructure measurement, and so on. Finally, the existing challenges and promising future directions are discussed.http://www.mdpi.com/2076-3417/9/1/109laser feedbackprecision measurementfrequency-shiftedsolid-state laser |
| spellingShingle | Kaiyi Zhu Hongfang Chen Shulian Zhang Zhaoyao Shi Yun Wang Yidong Tan Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser Applied Sciences laser feedback precision measurement frequency-shifted solid-state laser |
| title | Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser |
| title_full | Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser |
| title_fullStr | Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser |
| title_full_unstemmed | Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser |
| title_short | Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser |
| title_sort | frequency shifted optical feedback measurement technologies using a solid state microchip laser |
| topic | laser feedback precision measurement frequency-shifted solid-state laser |
| url | http://www.mdpi.com/2076-3417/9/1/109 |
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